Prof. Lidia Lukasiak Profile

Prof. Lidia Lukasiak

at Warsaw Univ of Technology

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Author

Publications (6)

Proceedings Article | 22 December 2016 Paper

Modeling high-frequency capacitance in SOI MOS capacitors

Lidia Łukasiak, Jakub Jasiński, Romuald Beck, Fawzi Ikraiam

Proceedings Volume 10175, 101750C (2016) https://doi.org/10.1117/12.2260788

KEYWORDS: Stereolithography, Interfaces, Capacitance, Semiconductors, Molybdenum, Capacitors, Oxides, Silicon, Thin films, Microelectronics

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Proceedings Article | 22 December 2016 Paper

Simulation of electrical characteristics of GaN vertical Schottky diodes

Lidia Łukasiak, Jakub Jasiński, Andrzej Jakubowski

Proceedings Volume 10175, 101750B (2016) https://doi.org/10.1117/12.2260777

KEYWORDS: Gallium nitride, Diodes, Doping, Monte Carlo methods, Dielectrics, Ionization, Resistance, Switching, Instrument modeling, Reverse modeling

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Proceedings Article | 25 July 2013 Paper

Nanostructures applied to bit-cell devices

Andrzej Kołodziej, Lidia Łukasiak, Michał Kołodziej

Proceedings Volume 8902, 89020X (2013) https://doi.org/10.1117/12.2031301

KEYWORDS: Silicon, Metals, Silver, Oxides, Nanocrystals, Neodymium, Transistors, Microelectromechanical systems, Nanostructures, Nanoparticles

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Proceedings Article | 25 July 2013 Paper

Modeling the current of a double-gate MOSFET with very thin active region taking into account mobility dependence on the transverse electric field

Lidia Łukasiak, Bogdan Majkusiak

Proceedings Volume 8902, 89020L (2013) https://doi.org/10.1117/12.2031070

KEYWORDS: Field effect transistors, Oxides, Silicon, Instrument modeling, Process control, Data modeling, Microelectronics, Optoelectronics, Molybdenum, Transistors

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Proceedings Article | 25 July 2013 Paper

Electrical characterization of GaN-channel MOSFETs

Jakub Jasiński, Lidia Łukasiak, Andrzej Jakubowski, Do-Kywn Kim, Dong-Seok Kim, Sung-Ho Hahm, Jung-Hee Lee

Proceedings Volume 8902, 89020U (2013) https://doi.org/10.1117/12.2031288

KEYWORDS: Gallium nitride, Field effect transistors, Resistance, Reliability, Interfaces, Capacitance, Semiconductors, Transistors, Dielectrics, Surface roughness

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Showing 5 of 6 publications

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