Dr. Lin Zhang Profile

Dr. Lin Zhang

at China Academy of Engineering Physics

SPIE Involvement:

Author

Publications (17)

SPIE Journal Paper | 30 December 2020

Accurate determination of random pattern phase in structured illumination microscopy with low modulation depth

Xinying Cui, Ning Chen, Jinxi Bai, Zhendong Shi, Hua Ma, Yi Yang, Ke Ma, Huan Ren, Liqun Chai, Lei Chen, Lin Zhang

OE, Vol. 59, Issue 12, 123105, (December 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.12.123105

KEYWORDS: Reconstruction algorithms, Modulation, Phase shift keying, Error analysis, Super resolution, Phase shifts, Image processing, Microscopy, Optical engineering, Computer simulations

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Proceedings Article | 12 January 2018 Paper

Influence of pitting defects on quality of high power laser light field

Huan Ren, Lin Zhang, Yi Yang, Zhendong Shi, Hua Ma, Hongzhen Jiang, Bo Chen, XiaoYu Yang, Wanguo Zheng, Rihong Zhu

Proceedings Volume 10619, 1061911 (2018) https://doi.org/10.1117/12.2304292

KEYWORDS: Optical components, Near field, High power lasers, Numerical simulations, Thermal effects, Laser systems engineering

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Proceedings Article | 12 January 2018 Paper

Femtosecond Z-scan measurements of the nonlinear refractive index of fused silica

Lin Zhang, Zhendong Shi, Hua Ma, Huan Ren, Quan Yuan, Yurong Ma, Xiaoxuan Feng, Bo Chen, Yi Yang

Proceedings Volume 10621, 106210H (2018) https://doi.org/10.1117/12.2295559

KEYWORDS: Femtosecond phenomena, Refractive index, Silica, Metrology, Nonlinear optics, Nonlinear optical materials, High power lasers, Laser systems engineering, Optical components, Phase shift keying

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Proceedings Article | 24 October 2017 Paper

Uncertainty analysis of distortion measurement of laser differential confocal by different evaluation methods

Quan Yuan, Yi Yang, Lin Zhang, Zhendong Shi, Hua Ma, Huan Ren

Proceedings Volume 10457, 104570L (2017) https://doi.org/10.1117/12.2282996

KEYWORDS: Confocal microscopy, Uncertainty analysis, Distortion, Laser systems engineering

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Proceedings Article | 19 October 2016 Paper

Determining the nonlinear refractive index of fused quartz by femtosecond laser Z-scan technology

Lin Zhang, Huan Ren, Hua Ma, Zhendong Shi, Yi Yang, Quan Yuan, Xiaoxuan Feng, Yurong Ma, Bo Chen

Proceedings Volume 10155, 101551N (2016) https://doi.org/10.1117/12.2246627

KEYWORDS: Refractive index, Fused quartz, Femtosecond phenomena, Laser applications, Thermal energy technology, Thermal effects

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Proceedings Article | 27 September 2016 Paper

Interferometry measurement of parallel optical plate wavefront

Yi Yang, Huan Ren, Zhendong Shi, Yong Liu, Xu Liu, Quan Yuan, Xiaoyu Yang, Lin Zhang

Proceedings Volume 9684, 96843J (2016) https://doi.org/10.1117/12.2246099

KEYWORDS: Wavefronts, Modulation, Optical testing, Interferometry, Wavefront aberrations, Fourier transforms, Phase interferometry, Reflection, Testing and analysis, Lithium

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Proceedings Article | 27 September 2016 Paper

Different environmental conditions from the effects of repetitive fixed focus lens of long focal distance

Yuan Quan, Lin Zhang, Huan Ren, Yi Yang, Zhen-dong Shi, Hua Ma, Ke Ma, Yu-rong Ma, Xiao-xuan Feng

Proceedings Volume 9684, 96841L (2016) https://doi.org/10.1117/12.2245567

KEYWORDS: Confocal microscopy, Environmental sensing, Distance measurement, Mirrors, Temperature metrology, Moire patterns, Laser applications, Refractive index, Optical testing, Imaging systems

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Proceedings Article | 27 September 2016 Paper

A simple method for focal length measurement

Hua Ma, Huan Ren, Lin Zhang, Zhengdong Shi, Quan Yuan, Yi Yang

Proceedings Volume 9684, 96843R (2016) https://doi.org/10.1117/12.2245081

KEYWORDS: Spherical lenses, Image processing, Optical testing, Error analysis, Sensors, Collimation, Confocal microscopy, Holograms, Laser applications, Computing systems

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Proceedings Article | 27 September 2016 Paper

Three-dimensional measurement of multilayer thin films based on scanning white light interferometer

Zhendong Shi, Lin Zhang, Huan Ren, Quan Yuan, Yi Yang, Hua Ma

Proceedings Volume 9684, 96841R (2016) https://doi.org/10.1117/12.2244511

KEYWORDS: Multilayers, Thin films, Interferometers, 3D scanning, Optical testing, Reflection, Interfaces, 3D metrology, Light sources, Light

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Proceedings Article | 22 June 2015 Paper

A Non-scanning Reflection Technique (NRT) for measurements of optical nonlinearities

Lin Zhang, Huan Ren, Yi Yang, Quan Yuan, Yong Liu, Zhendong Shi, Hua Ma, Bo Chen, Tingkui Mu

Proceedings Volume 9525, 95252V (2015) https://doi.org/10.1117/12.2184525

KEYWORDS: Reflectivity, Reflection, Nonlinear optics, Optical testing, Refractive index, Pulsed laser operation, Absorption, Numerical simulations, Glasses, Attenuators

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Proceedings Article | 3 December 2014 Paper

Principal and error analysis of mirror symmetry method in three-flat test

Yong Liu, Xu Liu, Hongzhen Jiang, Yuhang He, Huan Ren, Yi Yang, Lin Zhang, Zhendong Shi, Quan Yuan

Proceedings Volume 9297, 929710 (2014) https://doi.org/10.1117/12.2071921

KEYWORDS: Mirrors, Photovoltaics, Error analysis, Wavefronts, Interferometry, Optical testing, Zernike polynomials, Laser welding, Fizeau interferometers

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Proceedings Article | 3 December 2014 Paper

Analyses of multiple surfaces transform interferometry in parallel plate measurement

Lin Zhang, Huan Ren, Yi Yang, Yong Liu, Zhendong Shi, Quan Yuan, Hongzhen Jiang

Proceedings Volume 9297, 92970Y (2014) https://doi.org/10.1117/12.2071877

KEYWORDS: Interferometry, Phase shifts, Fourier transforms, Interferometers, Reflection, Error analysis, Photovoltaics, Analytical research, Phase interferometry, Refractive index

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Proceedings Article | 30 August 2013 Paper

Effect of assembly error of polarization array on a Polarizing Atmospheric Michelson Interferometer

Lin Zhang, Chunmin Zhang, Wenyi Ren, Jinchan Wang

Proceedings Volume 8910, 89101V (2013) https://doi.org/10.1117/12.2034829

KEYWORDS: Polarization, Polarizers, Michelson interferometers, Doppler effect, Interferometers, Temperature metrology, Imaging systems, Velocity measurements, Glasses, Wind measurement

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SPIE Journal Paper | 1 April 2010

Design and analysis of wide-field-of-view polarization imaging spectrometer

Tingkui Mu, Chunmin Zhang, Wenyi Ren, Lin Zhang, Ning Liu

OE, Vol. 49, Issue 04, 043002, (April 2010) https://doi.org/10.1117/12.10.1117/1.3386079

KEYWORDS: Surface plasmons, Spectroscopy, Crystals, Polarization, Interferometers, Fourier transforms, Imaging systems, Calcite, Optical engineering, Sensors

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Proceedings Article | 11 March 2008 Paper

Influence of annealing temperature on microstructures and resistivity of FexAl1-x films

Shuichang Yang, Zhijun Liao, Zhenliang Liu, Weidong Wu, Dengxue Wu, Tiecheng Lu, Lin Zhang, Yongjian Tang

Proceedings Volume 6984, 69842A (2008) https://doi.org/10.1117/12.792025

KEYWORDS: Annealing, Thin films, Electron beams, Silicon films, Temperature metrology, Physics, Silicon, Crystals, Diffraction, X-ray diffraction

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Proceedings Article | 11 March 2008 Paper

The influence of the substrate temperature variation on FexAl1-x thin films deposition

Zhenliang Liu, Zhijun Liao, Shuichang Yang, Weidong Wu, Dengxue Wu, Tiecheng Lu, Lin Zhang, Yongjian Tang

Proceedings Volume 6984, 69842B (2008) https://doi.org/10.1117/12.792027

KEYWORDS: Thin films, Atomic force microscopy, Thin film deposition, Physics, Electron beams, Surface roughness, Adsorption, Iron, Aluminum, Temperature metrology

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Proceedings Article | 12 December 2003 Paper

Preparation and properties of perdeuterated polystyrene films

Lin Zhang, Kai Du, Houqiong Zhang, Haiyan Tu

Proceedings Volume 5228, (2003) https://doi.org/10.1117/12.537455

KEYWORDS: Double positive medium, Polymers, Polymer thin films, Glasses, Molecules, Polymeric sensors, Polymerization, Temperature metrology, Fusion energy, Sensors

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Showing 5 of 17 publications

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