Mr. Madan Dubey Profile

Madan Dubey

SPIE Involvement:

Author

Proceedings Article | 10 September 2019 Presentation

Two-dimensional MoS2-enabled flexible rectenna for wireless energy harvesting in the Wi-Fi band (Conference Presentation)

Xu Zhang, Jesús Grajal, Jose Luis Vazquez-Roy, Ujwal Radhakrishna, Xiaoxue Wang, Winston Chern, Lin Zhou, Yuhao Zhang, Han Wang, Madan Dubey, Jing Kong, Mildred Dresselhaus, Tomas Palacios

Proceedings Volume 11089, 1108919 (2019) https://doi.org/10.1117/12.2530059

KEYWORDS: Energy harvesting, Semiconductors, Diodes, Flexible circuits, Transistors, Sensors, Electromagnetism, Heterojunctions, Capacitance, Resistance

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Proceedings Article | 4 June 2014 Paper

Nanostructured detector technologies for optical sensing applications

Ashok Sood, Roger Welser, Yash Puri, Nibir Dhar, Dennis Polla, Priyalal Wijewarnasuriya, Madan Dubey

Proceedings Volume 9100, 91000N (2014) https://doi.org/10.1117/12.2058152

KEYWORDS: Zinc oxide, Ultraviolet radiation, Silica, Sensors, Gallium nitride, Resistance, Nanostructures, Scanning electron microscopy, Optical sensing, Temperature metrology

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Proceedings Article | 19 September 2013 Paper

Unleashing giant TCR from phase changes in carbon nanotube composites

Gustavo Fernandes, Jin Ho Kim, Jimmy Xu, Ashok Sood, Nibir Dhar, Madan Dubey

Proceedings Volume 8868, 88680S (2013) https://doi.org/10.1117/12.2028182

KEYWORDS: Composites, Resistance, Carbon nanotubes, Infrared detection, Bolometers, Polymers, Temperature metrology, Signal detection, Sensors, Infrared radiation

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Proceedings Article | 15 October 2012 Paper

Design and development of carbon nanotube and graphene based microbolometer for IR imaging applications

Ashok Sood, E. Egerton, Yash Puri, Neil Goldsman, Xi Shao, Akin Akturk, Nibir Dhar, Madan Dubey, Priyalal Wijewarnasuriya, Bobby Lineberry

Proceedings Volume 8512, 851205 (2012) https://doi.org/10.1117/12.974241

KEYWORDS: Bolometers, Graphene, Resistance, Microbolometers, Infrared radiation, Carbon nanotubes, Infrared bolometers, Infrared imaging, Sensors, Mid-IR

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Proceedings Article | 31 May 2012 Paper

Design and development of carbon nanotube-based microbolometer for IR imaging applications

Ashok Sood, E. James Egerton, Yash Puri, Gustavo Fernandes, Jimmy Xu, Akin Akturk, Neil Goldsman, Nibir Dhar, Madan Dubey, Priyalal Wijewarnasuriya, Bobby Lineberry

Proceedings Volume 8353, 83533A (2012) https://doi.org/10.1117/12.923020

KEYWORDS: Resistance, Bolometers, Microbolometers, Nanostructures, Carbon, Thermography, Infrared radiation, Capacitance, Carbon nanotubes, Infrared imaging

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Proceedings Article | 21 September 2011 Paper

Diode-coupled Ag nanoantennas for nanorectenna energy conversion

Richard Osgood, Stephen Giardini, Joel Carlson, Gustavo Fernandes, Jin Ho Kim, Jimmy Xu, Matthew Chin, Barbara Nichols, Madan Dubey, Philip Parilla, Joseph Berry, David Ginley, Prakash Periasamy, Harvey Guthrey, Ryan O'Hayre, Walter Buchwald

Proceedings Volume 8096, 809610 (2011) https://doi.org/10.1117/12.893313

KEYWORDS: Diodes, Antennas, Metals, Teeth, Oxides, Pulsed laser operation, Niobium, Nickel, Silver, Nanoantennas

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SPIE Journal Paper | 1 October 2009

Chalcogenide glass e-beam and photoresists for ultrathin grayscale patterning

Andriy Kovalskyy, Jiri Cech, Miroslav Vlcek, Christopher Waits, Madan Dubey, William Heffner, Himanshu Jain

JM3, Vol. 8, Issue 04, 043012, (October 2009) https://doi.org/10.1117/12.10.1117/1.3273966

KEYWORDS: Etching, Thin films, Photoresist materials, Silicon, Fresnel lenses, Reactive ion etching, Chalcogenide glass, Arsenic, Photomasks, Silver

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Proceedings Article | 1 April 2009 Paper

Chalcogenide glass thin film resists for grayscale lithography

A. Kovalskiy, J. Cech, C. Tan, W. Heffner, E. Miller, C. Waits, M. Dubey, W. Churaman, M. Vlcek, H. Jain

Proceedings Volume 7273, 72734A (2009) https://doi.org/10.1117/12.811646

KEYWORDS: Thin films, Etching, Silicon, Fresnel lenses, Silver, Photoresist materials, Photomasks, Polymers, Grayscale lithography, Glasses

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Proceedings Article | 31 March 2008 Paper

Pre- and post-machining and release residual stresses in microelectromechanical systems (MEMS)

Mary Vechery, Andrew Dick, B. Balachandran, Madan Dubey

Proceedings Volume 6931, 69310B (2008) https://doi.org/10.1117/12.776262

KEYWORDS: Resonators, Thin films, Microelectromechanical systems, Semiconducting wafers, Microresonators, Data modeling, Ferroelectric materials, Remote sensing, Platinum, Thin film devices

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A major concern in the development of microelectromechanical systems (MEMS) is the presence of residual stress. This stress, which is produced during the fabrication of multi-layer thin-film structures, can significantly affect the performance of micro-scale devices. Though experimental measurement techniques are accurate, actual stress measurements can vary dramatically from run to run and wafer to wafer. For this reason, the modeling of this stress can be a challenging task. Past work has often focused on experimental, static techniques for determining residual-stress levels in single-layer and bi-layer structures. In addition, in prior studies, the focus has primarily been on residual-stress measurements in thin films as they are being deposited and prior to the release of a particular device. In this effort, residual stresses in MEMS resonators are characterized pre- and post-micro-machining and release of the structures. This is accomplished by applying three residual-stress identification techniques. The first technique, which is based on wafer-bow measurements and Stoney's formula, is suited for determining the residual stresses in thin film layers as they are being deposited and before the occurrence of a micro-machining or release process. In the second technique, a static parametric identification technique, device deflection data is made use of to approximate individual device residual stress immediately after release of a structure. The third technique, a dynamic parametric identification technique, which can be based on linear or nonlinear frequency response data can be used to estimate device residual stress immediately after release and after the device has been polarized. The results obtained by using these techniques are used to develop an understanding of how geometry, fabrication, release and polarization of resonators affect the stress state in a piezoelectric device. The results, which show that the stress levels can be quite different after a device has been released and poled, point to the importance of considering parameter identification schemes such as those described in this effort for identifying residual stresses in multi-layer, micro-structures.

Proceedings Article | 11 April 2007 Paper

Comparison of techniques for measurement of residual stresses in multilayered micro-electro-mechanical devices

Mary Vechery, A. Dick, B. Balachandran, M. Dubey

Proceedings Volume 6528, 65280D (2007) https://doi.org/10.1117/12.715692

KEYWORDS: Resonators, Semiconducting wafers, Thin films, Microelectromechanical systems, Composites, Ferroelectric materials, Measurement devices, Platinum, Microresonators, Thin film devices

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Proceedings Article | 29 March 1996 Paper

Three-dimensional packaging of very large scale integrated optics (VLSIO) for high-complexity optical systems

Lawrence West, Charles Roberts, Emil Piscani, Madan Dubey, Kenneth Jones, George McLane

Proceedings Volume 2691, (1996) https://doi.org/10.1117/12.236921

KEYWORDS: Waveguides, Electronics, Optics manufacturing, Integrated optics, Teeth, Optical components, Logic devices, Free space, Packaging, Capacitance

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Proceedings Article | 10 January 1996 Paper

Germanium waveguide for optical interconnects in very large scale integrated optics

Madan Dubey, Richard Lareau, Melanie Cole, Kenneth Jones, Lawrence West, Charles Roberts, Emil Piscani

Proceedings Volume 2695, (1996) https://doi.org/10.1117/12.229956

KEYWORDS: Germanium, Oxides, Absorption, Oxygen, Gallium arsenide, Crystals, FT-IR spectroscopy, Gold, Temperature metrology, Transmission electron microscopy

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Proceedings Article | 10 January 1996 Paper

Using very large scale integrated optics (VLSIO) to create high-complexity optoelectronic components

Lawrence West, Charles Roberts, Emil Piscani, Madan Dubey, Kenneth Jones, George McLane

Proceedings Volume 2695, (1996) https://doi.org/10.1117/12.229951

KEYWORDS: Waveguides, Integrated optics, Optics manufacturing, Electronics, Teeth, Optical components, Logic devices, Free space, Capacitance, Manufacturing

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Proceedings Article | 10 January 1996 Paper

GHz modulators in the midinfrared using ultrahigh-confinement waveguides

Lawrence West, Charles Roberts, Emil Piscani, Madan Dubey, Kenneth Jones, George McLane

Proceedings Volume 2695, (1996) https://doi.org/10.1117/12.229959

KEYWORDS: Waveguides, Modulators, Quantum wells, Absorption, Germanium, Modulation, Gallium arsenide, Electrodes, Infrared radiation, Mid-IR

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Showing 5 of 14 publications

Conference Committee Involvement (1)

Bio-Inspired/Biomimetic Sensor Technologies and Applications

13 April 2009 | Orlando, Florida, United States

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