Dr. Majid Leonard Riaziat Profile

Dr. Majid Leonard Riaziat

President at OEpic Semiconductors Inc

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 9 March 2020 Presentation

Progress in MHCG VCSELs (Conference Presentation)

James Lott, Tomasz Czyszanowski, Majid Riaziat, Martin Zorn, Marcin Gebski

Proceedings Volume 11300, 113000T (2020) https://doi.org/10.1117/12.2547328

KEYWORDS: Vertical cavity surface emitting lasers, Mirrors, Distributed Bragg reflectors, Modulation

Read Abstract +

Proceedings Article | 24 February 2020 Paper

Comparison of 850 nm VCSEL oxide aperture designs

Marcin Gębski, Nasibeh Haghighi, Philip Moser, James Lott, Niels Heermeier, Ping-Show Wong, Majid Riaziat

Proceedings Volume 11300, 113000J (2020) https://doi.org/10.1117/12.2552196

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Optical resonators

Read Abstract +

Proceedings Article | 4 March 2019 Presentation

Electrically-injected VCSELs incorporating monolithic high-index contrast grating mirrors (Conference Presentation)

Marcin Gebski, James Lott, Tomasz Czyszanowski, Majid Riaziat, Martin Zorn

Proceedings Volume 10938, 1093808 (2019) https://doi.org/10.1117/12.2508654

KEYWORDS: Vertical cavity surface emitting lasers, Mirrors, Gallium arsenide, LIDAR, Reflectivity, Ultraviolet radiation, Infrared radiation, Distributed Bragg reflectors, Free space, Facial recognition systems

Read Abstract +

Proceedings Article | 28 February 2017 Paper

Reliability and manufacturability of 25G VCSELs with oxide apertures formed by in-situ monitoring

James Pao, Ta-Chung Wu, Wilson Kyi, Majid Riaziat, James Lott

Proceedings Volume 10115, 1011519 (2017) https://doi.org/10.1117/12.2253565

KEYWORDS: Oxidation, Vertical cavity surface emitting lasers, Reliability, Manufacturing, Oxides, Semiconducting wafers, Resistance, Process control, Atmospheric propagation, Semiconductors, Picosecond phenomena, Quantum wells, Oxygen

Read Abstract +

Proceedings Article | 25 February 2017 Presentation + Paper

Tunnel junction 850-nm VCSEL for aperture uniformity and reliability

P. S. Wong, J. Yan, T. C. Wu, J. Pao, M. Riaziat, W. Kyi

Proceedings Volume 10122, 101220B (2017) https://doi.org/10.1117/12.2253053

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Semiconductors, Gallium arsenide, Doping, Tellurium

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years