Makoto Nakamura
Applications Engineer at ASML
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 October 2006 Paper
Nazneen Jeewakhan, Nader Shamma, Sang-Jun Choi, Roque Alvarez, D. Son, Makoto Nakamura, Vinny Pici, Jim Schreiber, Wei-shun Tzeng, Sean Ang, Daniel Park
Proceedings Volume 6349, 63490G (2006) https://doi.org/10.1117/12.692938
KEYWORDS: Etching, Critical dimension metrology, Semiconducting wafers, Charge-coupled devices, Lithography, Tolerancing, Reticles, Manufacturing, Neodymium, Photomasks

Proceedings Article | 22 January 2001 Paper
Proceedings Volume 4186, (2001) https://doi.org/10.1117/12.410770
KEYWORDS: Reticles, Photoresist materials, Semiconducting wafers, Chromium, Photomasks, Absorption, Scanning electron microscopy, Ultraviolet radiation, Spectrophotometry, Absorbance

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