Nicolas Bonnot
at Univ de Bourgogne
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 May 2004 Paper
Nicolas Bonnot, Ralph Seulin, Frederic Merienne
Proceedings Volume 5303, (2004) https://doi.org/10.1117/12.530683
KEYWORDS: Light sources and illumination, Inspection, Machine vision, Image processing, Image segmentation, Manufacturing, Defect detection, Cameras, Control systems, Scene classification

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