Mr. Oleg N. Gilev Profile

Oleg N. Gilev

at Russian Federal Nuclear Ctr

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Author

Publications (4)

Proceedings Article | 23 April 2001 Paper

Absorption and transformation of laser energy in picosecond laser-plasma experiments at intensity of 1016 to 1019 W/cm2

Vladimir Borodin, Alexander Charukchev, Victor Chernov, Oleg Gilev, Anatoly Zapysov, Vladimir Il'in, Vladimir Komarov, Vladimir Malinov, Vaycheslav Migel, Nikolai Nikitin, V. Saprikin

Proceedings Volume 4424, (2001) https://doi.org/10.1117/12.425636

KEYWORDS: Ions, Absorption, Plasma, Hard x-rays, Optical filters, Sensors, Laser energy, Picosecond phenomena, X-rays, Pulsed laser operation

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Proceedings Article | 2 November 2000 Paper

X-ray investigations of a near surface layer of metal samples

Oleg Gilev, Victor Asadchikov, Angela Duparre, Nikolai Havronin, Igor Kozhevnikov, Yury Krivonosov, Sergey Kuznetsov, Vitaly Mikerov, Vladimir Ostashev, Vladimir Tukarev

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405828

KEYWORDS: X-rays, Reflectivity, Scattering, Reflection, Dielectrics, Atomic force microscopy, Surface roughness, Laser scattering, Statistical modeling, Metals

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Proceedings Article | 6 September 1999 Paper

Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods

Igor Kozhevnikov, Victor Asadchikov, Angela Duparre, Oleg Gilev, Nikolai Havronin, Yury Krivonosov, Vladimir Ostashev, Joerg Steinert

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360165

KEYWORDS: Scattering, Atomic force microscopy, X-rays, Light scattering, Spatial frequencies, Silver, Hard x-rays, Scatter measurement, X-ray microscopy, Surface roughness

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Proceedings Article | 6 September 1999 Paper

X-ray study of concave surface roughness

Inna Bukreeva, Victor Asadchikov, Oleg Gilev, Nikolai Havronin, Igor Kozhevnikov, Yury Krivonosov, Vladimir Ostashev, Spartak Sagitov

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360171

KEYWORDS: Mirrors, X-rays, Surface roughness, Scattering, Sensors, Laser scattering, Computer simulations, X-ray detectors, Laser beam diagnostics, Reflection

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