Dr. Olek P. Kowalski Profile

Dr. Olek P. Kowalski

at SMART Photonics

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 3 February 2009 Paper

Ultra-fine pitch individually addressable visible laser arrays for high speed digital printing applications

O. Kowalski, S. McDougall, B. C. Qiu, G. Masterton, M. Armstrong, S. Robertson, S. Caldecott, J. Marsh

Proceedings Volume 7230, 72301J (2009) https://doi.org/10.1117/12.809088

KEYWORDS: Laser bonding, Scanning electron microscopy, Ceramics, Laser applications, Printing, Semiconductor lasers, Metals, Semiconducting wafers, Waveguides, Image processing

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Proceedings Article | 29 January 2008 Paper

High reliability, high power arrays of 808 nm single mode diode lasers employing various quantum well structures

B. Qiu, O. Kowalski, S. McDougall, X. Liu, J. Marsh

Proceedings Volume 6909, 69090S (2008) https://doi.org/10.1117/12.763208

KEYWORDS: Quantum wells, Reliability, Waveguides, Gallium arsenide, Aluminum, Semiconductor lasers, Indium gallium arsenide, Cladding, High power lasers, Continuous wave operation

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Proceedings Article | 7 February 2007 Paper

High-power high-brightness high-reliability laser diodes emitting at 800-1000 nm

Dan Yanson, John Marsh, Stephen Najda, Stewart McDougall, Hassan Fadli, Graeme Masterton, Bocang Qiu, Olek Kowalski, Gianluca Bacchin, Gordon McKinnon

Proceedings Volume 6456, 64560L (2007) https://doi.org/10.1117/12.699038

KEYWORDS: High power lasers, Epitaxy, Reliability, Semiconductor lasers, Nonabsorbing mirrors, Waveguides, Quantum wells, Laser development, Pulsed laser operation, Coating

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Proceedings Article | 11 May 2004 Paper

Benefits of quantum well intermixing in high power diode lasers

Stephen Najda, Gianluca Bacchin, Bocang Qiu, Xuefeng Liu, Olek Kowalski, Mark Silver, Stewart McDougall, Craig Hamilton, John Marsh

Proceedings Volume 5365, (2004) https://doi.org/10.1117/12.530263

KEYWORDS: Quantum wells, Semiconductor lasers, Nonabsorbing mirrors, High power lasers, Plasma enhanced chemical vapor deposition, Reliability, Manufacturing, Tolerancing, Absorption, Fabrication

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