Semiconductor market demand for improved performance at lower cost continues to drive enhancements in excimer
light source technologies. Increased output power, reduced variability in key light source parameters, and improved
beam stability are required of the light source to support immersion lithography, multi-patterning, and 450mm wafer
applications in high volume semiconductor manufacturing. To support future scanner needs, Cymer conducted a
technology demonstration program to evaluate the design elements for a 120W ArFi light source. The program was
based on the 90W XLR 600ix platform, and included rapid power switching between 90W and 120W modes to
potentially support lot-to-lot changes in desired power. The 120W requirements also included improved beam
stability in an exposure window conditionally reduced by 20%. The 120W output power is achieved by efficiency
gains in system design, keeping system input power at the same level as the 90W XLR 600ix. To assess system to
system variability, detailed system testing was conducted from 90W – 120W with reproducible results.
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