Mr. Samuel F. Pellicori Profile

Samuel F. Pellicori

Thin-Film Engineering Consultant at S. F. Pellicori

SPIE Involvement:

Author

Area of Expertise:

Optical thin films process engineering , Optical instruments design , Coating design and engineering UV to Far IR

Profile Summary

Consulting engineering services specializing in optical coating design, application analysis, specification, deposition technology, and problem solving. Design and development of spectro-radiometric, polarimetric and imaging instruments for industrial, aerospace, medical, commercial, and entertainment applications. Covering applications from UV to Far-IR including space and hostile environments. Technical proposal and patent preparation.

Publications (6)

Proceedings Article | 1 September 2017 Paper

Segmented Aperture Interferometric Nulling Testbed (SAINT) II: component systems update

Brian Hicks, Matthew Bolcar, Michael Helmbrecht, Peter Petrone, Elliot Burke, James Corsetti, Thomas Dillon, Andrew Lea, Samuel Pellicori, Teresa Sheets, Ron Shiri, Jack Agolli, John DeVries, Andrew Eberhardt, Tyler McCabe

Proceedings Volume 10400, 104001I (2017) https://doi.org/10.1117/12.2273905

KEYWORDS: Interferometry, Imaging systems, Image segmentation, Segmented mirrors, Control systems, Space telescopes, Telescopes, Wavefronts, Nulling interferometry, Wavefront sensors

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Proceedings Article | 12 August 2009 Paper

Evaluation of the polarization properties of a Philips-type prism for the construction of imaging polarimeters

R. Fernandez-Borda, E. Waluschka, S. Pellicori, J. V. Martins, L. Ramos-Izquierdo, J. D. Cieslak, Patrick Thompson

Proceedings Volume 7461, 746113 (2009) https://doi.org/10.1117/12.829080

KEYWORDS: Polarization, Prisms, Polarimetry, Interfaces, Dielectric polarization, Optical coatings, Zemax, Sensors, Computer simulations, Human-machine interfaces

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