Mr. Sebastian Obwaller Profile

Sebastian Obwaller

at cosine measurement systems

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Publications (1)

Proceedings Article | 5 October 2023 Presentation + Paper

High-resolution and light-weight silicon pore x-ray optics

Boris Landgraf, Luis Abalo, Nicolas Barrière, Alex Bayerle, Donny de Borst, Luigi Castiglione, Maximilien Collon, Loes Crama, Abdelhakim Chatbi, Noë Eenkhoorn, David Girou, Ramses Günther, Enrico Hauser, Roy van der Hoeven, Jasper den Hollander, Yvette Jenkins, Adam Lassise, Laurens Keek, Christian Körnig, Sebastian Obwaller, Ben Okma, Paulo da Silva Ribeiro, Chris Rizos, Aniket Thete, Giuseppe Vacanti, Sjoerd Verhoeckx, Mark Vervest, Roel Visser, Luc Voruz, Marcos Bavdaz, Eric Wille, Ivo Ferreira, Mathijs Bosman, Jeroen Haneveld, Arenda Koelewijn, Jan-Joost Lankwarden, Mark Olde Riekerink, Bart Schurink, Ronald Start, Maurice Wijnperle, Coen van Baren, Levent Cibik, Michael Krumrey, Dieter Skroblin, Vadim Burwitz, Finn Christensen, Desirée Della Monica Ferreira, Sonny Massahi, Diego Sanz, Sara Svendsen, Ethan Dunnell, Paul Lupton, William Mundon, Andrew Rees, Dan Watley

Proceedings Volume 12679, 1267903 (2023) https://doi.org/10.1117/12.2678106

KEYWORDS: Mirrors, Silicon, X-ray optics, Semiconducting wafers, Wafer-level optics, X-rays, Synchrotron radiation, Ion beam finishing, Mirror surfaces, Laser cutting

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