Dr. Sooyong Lee is a principal engineer at Samsung Semiconductor Research and Development (SRD). He holds a bachelor's and doctorate in physics from POSTECH, specializing in theoretical condensed matter physics. His experience includes postdoctoral research at POSTECH and Sungkyunkwan University, as well as a visiting researcher role at MIT. Initially, his research focused on electronic interferometers and topological matter in mesoscopic and many-body systems. After joining SRD, Dr. Lee transitioned his career towards Optical Proximity Correction (OPC). He has since been instrumental in developing resolution enhancement technologies for fine feature patterning in memory devices. Furthermore, Dr. Lee has significantly improved accuracy and reduced dispersion on wafers by implementing OPC and Process Proximity Correction (PPC) with machine learning. Recently, he completed an AI expert training program at Seoul National University and is currently spending a research year at Stanford University as a visiting researcher. His current interest lies in integrating cutting-edge AI technologies into OPC and PPC processes.