Proceedings Article | 18 September 2018
KEYWORDS: Crystals, Diamond, Manufacturing, X-rays, Synchrotron radiation, Hard x-rays, Laser crystals, Carbon, X-ray lasers, Free electron lasers
High-repetition-rate self-seeded x-ray free-electron lasers (XFELs),
such as the European XFEL in Hamburg (Germany) and upcoming LCLS-II-HE
in Stanford (USA) are promising up to three orders of magnitude
increase in average spectral flux than what is currently possible with
storage-ring-based synchrotron radiation sources [1-4]. This will open
up exciting new opportunities for hard x-ray spectroscopic
techniques. The new hard x-ray sources with the highest spectral
brilliance are offering not only opportunities. There are also
challenges, in particular, how to deal with the XFEL beams of very
high average and peak power.
To address these challenges we have designed, manufactured, and tested
diamond channel-cut crystals, to function as high-heat-load,
beam-multiplexing, and high-resolution (15-meV bandwidth)
monochromators. Diamond channel-cut crystals in the (008) and the
(620) orientations were manufactured at the Technological Institute
for Superhard and Novel Carbon Materials by application of the newest
laser machining technologies [5]. X-ray double-crystal sequential
topography and reflectivity studies performed at the Advanced Photon
Source demonstrate a close to theoretical performance of the diamond
channel cut crystals. We will present details on manufacturing and
characterization of the channel-cut crystals.
Acknowledgments Work at Argonne National Laboratory was supported by
the U.S. Department of Energy, Office of Science, under Contract
No. DE-AC02-06CH11357. Work at the Technological Institute for
Superhard and Novel Carbon Materials was supported by the Ministry of
Education and Science of the Russian Federation,
References
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[3] O. Chubar, G. Geloni, V. Kocharyan, A. Madsen, E. Saldin, S. Serkez, Yu. Shvyd’ko, and J. Sutter, J. Synchrotron Radiation, 23 (2016) 410–424
[4] G. Geloni, V. Kocharyan, E. Saldin arXiv:1508.04339 (2015)
[5] T. Kolodziej, P. Vodnala, S. Terentyev, V. Blank and Yu. Shvyd'ko, J. Appl. Cryst., 49 (2016) 1240