Dr. Towfik H. Teherani Profile

Dr. Towfik H. Teherani

at DRS Technologies & Targeting Systems Inc

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Author

Publications (6)

Proceedings Article | 18 May 2006 Paper

SWIR to LWIR HDVIP HgCdTe detector array performance

A. D'Souza, M. Stapelbroek, L. Dawson, P. Ely, C. Yoneyama, J. Reekstin, M. Skokan, M. Kinch, P. Liao, M. Ohlson, P. Ronci, T. Teherani, H. Shih, J. Robinson

Proceedings Volume 6206, 62062H (2006) https://doi.org/10.1117/12.669071

KEYWORDS: Sensors, Long wavelength infrared, Readout integrated circuits, Short wave infrared radiation, Mercury cadmium telluride, Quantum efficiency, Detector arrays, Mid-IR, Staring arrays, Diodes

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DRS uses LPE-grown SWIR, MWIR and LWIR HgCdTe material to fabricate High-Density Vertically Integrated Photodiode (HDVIP) architecture detectors. 2.5 μm, 5.3 μm and 10.5 μm cutoff detectors have been fabricated into linear arrays as technology demonstrations targeting remote sensing programs. This paper presents 320 x 6 array configuration technology demonstrations' performance of HDVIP HgCdTe detectors and single detector noise data. The single detector data are acquired from within the 320 x 6 array. Within the arrays, the detector size is 40 μm x 50 μm. The MWIR detector array has a mean quantum efficiency of 89.2% with a standard deviation to mean ratio, σ/μ = 1.51%. The integration time for the focal plane array (FPA) measurements is 1.76 ms with a frame rate of 557.7 Hz. Operability values exceeding 99.5% have been obtained. The LWIR arrays measured at 60 K had high operability with only ~ 3% of the detectors having out of family response. Using the best detector select (BDS) feature in the read out integrated circuit (ROIC), a feature that picks out the best detector in every row of six detectors, a 320 x 1 array with 100% operability is obtained. For the 320 x 1 array constituted using the BDS feature, a 100% operable LWIR array with average NEI value of 1.94 x 10¹¹ ph/cm²/s at a flux of 7.0 x 10¹⁴ ph/cm²/s has been demonstrated. Noise was measured at 60 K and 50 mV reverse bias on a column of 320 diodes from a 320 x 6 LWIR array. Integration time for the measurement was 1.76 ms. Output voltage for the detectors was sampled every 100^th frame. 32,768 frames of time series data were collected for a total record length of 98 minutes. The frame average for a number of detectors was subtracted from each detector to correct for temperature drift and any common-mode noise. The corrected time series data was Fourier transformed to obtain the noise spectral density as a function of frequency. Since the total time for collecting the 32,768 time data series points is 98.0 minutes, the minimum frequency is 170 μHz. A least squares fit of the form (A/f + B) is made to the noise spectral density data to extract coefficients A and B that relate to the 1/f and white noise of the detector respectively. In addition noise measurements were also acquired on columns of SWIR detectors. Measurements were made under illuminated conditions at 4 mV and 50 mV reverse bias and under dark conditions at 50 mV reverse bias. The total collection time for the SWIR detectors was 47.7 minutes. The detectors are white noise limited down to ~10 mHz under dark conditions and down to ~ 100 mHz under illuminated conditions.

Proceedings Article | 21 October 2005 Paper

SWIR to LWIR HgCdTe detectors and FPAs for remote sensing applications

A. D'Souza, M. Stapelbroek, L. Dawson, P. Ely, C. Yoneyama, J. Reekstin, H.-D. Shih, M. Skokan, T. Teherani, J. Robinson

Proceedings Volume 5978, 597818 (2005) https://doi.org/10.1117/12.627752

KEYWORDS: Sensors, Long wavelength infrared, Quantum efficiency, Readout integrated circuits, Remote sensing, Diodes, Mercury cadmium telluride, Mid-IR, Detector arrays, Short wave infrared radiation

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Proceedings Article | 21 October 2004 Paper

HDVIP for low-background-flux and high-operating-temperature applications

Paul LeVan, Franklin Roush, Hung-Dah Shih, Michael Kinch, Fikri Aqariden, Pok-Kai Liao, Peter Dreiske, Charles Franda, Thomas Orent, James Robinson, Herbert Schaake, Towfik Teherani, Arne Kalma

Proceedings Volume 5563, (2004) https://doi.org/10.1117/12.566370

KEYWORDS: Diodes, Mercury cadmium telluride, Metals, Mid-IR, Diffusion, Staring arrays, Liquid phase epitaxy, Doping, Mercury, Silicon

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Proceedings Article | 21 October 2004 Paper

High-operating-temperature infrared detectors based on HDVIP

Franklin Roush, Hung-Dah Shih, Thomas Orent, Charles Franda, Peter Dreiske, Fikri Aqariden, Michael Kinch, Pok-Kai Liao, James Robinson, Herbert Schaake, Towfik Teherani, Arne Kalma

Proceedings Volume 5563, (2004) https://doi.org/10.1117/12.566371

KEYWORDS: Microlens, Silicon, Mercury cadmium telluride, Microlens array, Infrared detectors, Sensors, Etching, Mid-IR, Staring arrays, Diodes

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Proceedings Article | 30 August 2004 Paper

Progress in DRS production line for uncooled focal plane arrays

Chien Han, Christopher Howard, Philip Howard, Adrian Ionescu, Chuan Li, John Monson, Robert Naranjo, Myron Scholten, R. Michael Sweeney, Roger Strong, William Sullivan, Towfik Teherani

Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.563836

KEYWORDS: Semiconducting wafers, Staring arrays, Sensors, Microbolometers, Packaging, Infrared technology, Infrared sensors, Imaging systems, Radiometry, Infrared radiation

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Proceedings Article | 13 July 1994 Paper

Producibility of Vertically Integrated Photodiode (VIP)tm scanning focal plane arrays

Arthur Turner, Towfik Teherani, John Ehmke, Cindy Pettitt, Peggy Conlon, Jeffrey Beck, Kent McCormack, Luigi Colombo, Tom Lahutsky, Terry Murphy, Robert Williams

Proceedings Volume 2228, (1994) https://doi.org/10.1117/12.179664

KEYWORDS: Staring arrays, Photodiodes, Infrared radiation, Mercury cadmium telluride, Integrated circuits, Ions, Diodes, Epoxies, Silicon, Semiconducting wafers

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