Dr. William Wade Sapp Profile

Dr. William Wade Sapp

Director of Technology at American Science and Engineering Inc

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Author

Publications (3)

Proceedings Article | 26 November 2002 Paper

Compact high-energy x-ray inspection systems for screening air cargo

William Sapp, Lee Grodzins, Peter Rothschild, Richard Schueller

Proceedings Volume 4786, (2002) https://doi.org/10.1117/12.451329

KEYWORDS: Inspection, X-rays, Beam shaping, Backscatter, Imaging systems, Prototyping, X-ray imaging, Environmental sensing, Image segmentation, Sensors

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Proceedings Article | 18 December 2000 Paper

New low-dose 1-MeV cargo inspection system with backscatter imaging

William Sapp, Peter Rothschild, Richard Schueller, Andrey Mishin

Proceedings Volume 4142, (2000) https://doi.org/10.1117/12.410560

KEYWORDS: Inspection, X-rays, Imaging systems, Backscatter, X-ray sources, X-ray imaging, X-ray detectors, Digital x-ray imaging, Spatial resolution

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Proceedings Article | 28 December 1998 Paper

Effect of energy on x-ray penetration and image quality

William Sapp, Suzhou Huang

Proceedings Volume 3575, (1998) https://doi.org/10.1117/12.335007

KEYWORDS: X-rays, Inspection, Signal attenuation, Image quality, X-ray imaging, Sensors, Imaging systems, X-ray sources, Electron beams, Iron

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