Prof. Ye Li
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 17 April 2020 Paper
Wei Wang, Ye Li, De Song, Xulei Qin
Proceedings Volume 11455, 114556S (2020) https://doi.org/10.1117/12.2565288
KEYWORDS: Semiconducting wafers, Silicon, Polishing, Imaging devices, Corrosion, Semiconductors, Wet etching, Charge-coupled devices, Image intensifiers, Image resolution

Proceedings Article | 17 April 2020 Paper
Wei Wang, Ye Li, De Song, Xulei Qin
Proceedings Volume 11455, 114556K (2020) https://doi.org/10.1117/12.2565274
KEYWORDS: Scattering, Monte Carlo methods, Computer simulations, Doping, Imaging devices, Back illuminated sensors, CMOS devices

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