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Yonghoon Kim
at Korea Univ
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Publications (1)
Proceedings Article | 17 September 2019 Presentation
Evolution of dislocation/stacking fault defects during two-step annealing (Conference Presentation)
Proceedings Volume 11114, 1111403 (2019) https://doi.org/10.1117/12.2531675
KEYWORDS: Annealing, Tellurium, Transmission electron microscopy, Cadmium, Sensors, Backscatter
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