Youngmin Jo
at KAIST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 May 2011 Paper
Proceedings Volume 8012, 80121O (2011) https://doi.org/10.1117/12.884432
KEYWORDS: Microbolometers, Resistance, Sensors, Infrared radiation, Vanadium, Aluminum, Oxides, Temperature metrology, Silica, Thermography

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