Dong Soo Kim
at KAIST
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 18 June 2013 Paper
Hyunbin Shim, Dongsoo Kim, Ingu Kang, Jinkwan Kim, Hee Chul Lee
Proceedings Volume 8704, 870420 (2013) https://doi.org/10.1117/12.2013929
KEYWORDS: Silicon, Transmittance, Semiconducting wafers, Long wavelength infrared, Annealing, Antireflective coatings, Coating, Infrared sensors, Nickel, Germanium

Proceedings Article | 21 May 2011 Paper
Proceedings Volume 8012, 80121P (2011) https://doi.org/10.1117/12.886913
KEYWORDS: Nickel, Oxides, Oxygen, Microbolometers, Heat treatments, Metals, Resistance, Sputter deposition, Amorphous silicon, Oxidation

Proceedings Article | 21 May 2011 Paper
Proceedings Volume 8012, 80121O (2011) https://doi.org/10.1117/12.884432
KEYWORDS: Microbolometers, Resistance, Sensors, Infrared radiation, Vanadium, Aluminum, Oxides, Temperature metrology, Silica, Thermography

Proceedings Article | 4 May 2010 Paper
Proceedings Volume 7660, 76601B (2010) https://doi.org/10.1117/12.850243
KEYWORDS: Nickel, Oxides, Thin films, Microbolometers, Oxygen, Resistance, Amorphous silicon, Bolometers, Metals, Electrical engineering

Proceedings Article | 7 May 2009 Paper
Proceedings Volume 7298, 72980O (2009) https://doi.org/10.1117/12.820153
KEYWORDS: Nickel, Oxides, Resistance, Thin films, Amorphous silicon, Bolometers, Oxygen, Infrared radiation, Sensors, Atomic force microscopy

Showing 5 of 6 publications
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