Mr. Yungi Lee Profile

Yungi Lee

at Fine Semitech Co Ltd

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 26 March 2019 Paper

Hangyeong Oh, Woojun Han, Yungi Lee, Jaisoon Kim

Proceedings Volume 10959, 109592I (2019) https://doi.org/10.1117/12.2514442

KEYWORDS: Imaging systems, Near field, Manufacturing, Image resolution, Objectives, Inspection, Sensors, Light emitting diodes, Microscopes, Titanium

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Keywords/Phrases