Mr. Yeomin Yoon Profile

Yeomin Yoon

at Gwangju Institute of Science and Technology

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 1 July 2015 Paper

Improvement in topology measurement accuracy of atomic force microscope using additional sensor

Yeomin Yoon, Jiseong Jeong, Junsup Kim, Kyihwan Park

Proceedings Volume 9655, 96550K (2015) https://doi.org/10.1117/12.2184430

KEYWORDS: Sensors, Ferroelectric materials, Scanners, Actuators, Optical sensors, Atomic force microscopy, Atomic force microscope, Image sensors, Optical testing, Laser scanners

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years