Paper
24 November 2021 Fabrication of Al2O3/TiO2 reflective type anti-blue light multi-layers with atomic layer deposition
Author Affiliations +
Proceedings Volume 12062, AOPC 2021: Optoelectronics and Nanophotonics; 120620O (2021) https://doi.org/10.1117/12.2606712
Event: Applied Optics and Photonics China 2021, 2021, Beijing, China
Abstract
The aim of this work is the formation of anti-blue light coatings which are suitable for application on 3C products. Atomic layer deposition was used to deposit Al2O3 and TiO2 single layer films onto glass substrates at 250 °C. Optical characterization of the films was conducted to evaluate whether the thickness was suitable for the fabrication of multipair reflective coatings. The refractive indices of the films measured at an optical wavelength of 450 nm were 1.68 (67 nm, Al2O3) and 2.67 (42 nm, TiO2). Al2O3/TiO2 multilayer DBRs with 1.5, 3.5, 5.5 and 7.5 pairs were deposited on glass substrates. The thickness of each layer of Al2O3 and TiO2 films were 63.7 and 49.6 nm in the multilayer structure measured via FE-TEM. When 1.5-pair Al2O3/TiO2 DBRs were deposited on the glass substrate, the films had high transparency, and less reflective effect were observed. As 3.5, 5.5 and 7.5-pair DBRs were deposited on the glass substrates, the Bragg reflection effect became apparent. We found 7.5-pair Al2O3/TiO2 DBRs prepared by ALD had the best central and bandwidth of the Bragg reflection effect for blue light.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jinhui Yang, Xueliang Lv, Zijin Li, Kaiyu Li, Qing Li, Tiezhu Bo, Yang Zhang, Jingming Zheng, Hui Liu, and Jinsheng Jia "Fabrication of Al2O3/TiO2 reflective type anti-blue light multi-layers with atomic layer deposition", Proc. SPIE 12062, AOPC 2021: Optoelectronics and Nanophotonics, 120620O (24 November 2021); https://doi.org/10.1117/12.2606712
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KEYWORDS
Aluminum

Reflectivity

Refractive index

Atomic layer deposition

Glasses

Transmission electron microscopy

Multilayers

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