Optical Engineering
VOL. 36 · NO. 2 | February 1997
CONTENTS
IN THIS ISSUE

Articles (42)
Articles
Brian Thompson
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601187
Open Access
Andreas Mandelis, Kirk Michaelian
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601597
Open Access
Agnes Chartier, Stephen Bialkowski
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601201
TOPICS: Temperature metrology, Spectroscopy, Absorption, Laser beam diagnostics, Diffusion, Bioalcohols, Absorbance, Semiconductor lasers, Lamps, Signal detection
Hugues Marchand, Alain Cournoyer, Franck Enguehard, Lionel Bertrand
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601202
TOPICS: Absorption, Phase shifts, Photoacoustic spectroscopy, Quantitative analysis, Carbon, Statistical modeling, Phase measurement, Spectroscopy, Diffusion, Optical engineering
S. Zhang, Kirk Michaelian, James Burt
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601203
TOPICS: Mica, Photoacoustic spectroscopy, Ferroelectric materials, Spectroscopy, FT-IR spectroscopy, Absorption, Mirrors, Infrared spectroscopy, Carbon monoxide, Visible radiation
Roscoe Carter III
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601204
TOPICS: Ultraviolet radiation, Photoacoustic spectroscopy, Absorption, Coating, Thin film coatings, Statistical modeling, Thermal modeling, Statistical analysis, Polymers, Phase measurement
Riju Issac, S. Harilal, Geetha Varier, C. Bindhu, V. Nampoori, C. Vallabhan
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601205
TOPICS: Optical limiting, Absorption, Molecules, Laser energy, Photoacoustic spectroscopy, Photons, Fullerenes, Molecular lasers, Pulsed laser operation, Laser damage threshold
W. Yahyaoui, D. Markovic, Robert Carpentier
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601206
TOPICS: Luminescence, Electron transport, Modulation, Photoacoustic spectroscopy, Quenching (fluorescence), Temperature metrology, Data storage, Signal processing, Oxygen, Optical engineering
I. Delgadillo, A. Cruz-Orea, Helion Vargas, Agapito Calderon, Juan Alvarado-Gil, Luiz Miranda
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601207
TOPICS: Thermal effects, Silicon, Photoacoustic spectroscopy, Crystals, Electrochemical etching, Etching, Resistance, Statistical modeling, Modulation, Thermal modeling
Juan Alvarado-Gil, Helion Vargas, F. Sanchez-Sinencio, Jesus Gonzalez-Hernandez, Luiz Miranda
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601421
TOPICS: Crystals, Dielectrics, Calcium, Absorption, Molecules, X-ray diffraction, Solids, Infrared spectroscopy, Optical engineering, X-rays
Alexej Glazov, Kyrill Muratikov
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601208
TOPICS: Laser beam diagnostics, Geometrical optics, Solids, Modulation, Thin films, Silicon films, Silicon, Phase shift keying, Photodetectors, Silica
Mihai Chirtoc, Dirk Giese, Bertram Arnscheidt, Nikolai Kalevitch, Josef Pelzl
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601209
TOPICS: Sensors, Personal protective equipment, Crystals, Temperature metrology, Picosecond phenomena, Ferroelectric materials, Calibration, Modulation, Epoxies, Ceramics
Jean-Francois Pelletier, Xavier Maldague
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601210
TOPICS: Thermography, Thermal modeling, Inspection, Infrared imaging, 3D image processing, Defect detection, Image segmentation, Infrared radiation, Image processing, Infrared cameras
Uwe Seidel, Ton Lan, Heinz-Guenter Walther, Bernhard Schmitz, Jurgen Geerkens, Gert Goch
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601235
TOPICS: Signal to noise ratio, Modulation, Ceramics, Diffusion, Deconvolution, Solids, Optical engineering, Point spread functions, Nondestructive evaluation, Wave propagation
Agustin Salazar, Agustin Sanchez-Lavega, Ana Ocariz
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601211
TOPICS: Radiometry, Diffusion, Anisotropy, Temperature metrology, Thermography, Laser beam diagnostics, Optical engineering, Modulation, Reflectivity, Crystals
Andreas Othonos, Andreas Mandelis, Marios Nestoros, Constantinos Christofides
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601212
TOPICS: Diagnostics, Thermography, Modulation, Infrared radiation, Absorption, Data modeling, Forensic science, Sensors, Optical engineering, Infrared lasers
Yves Berthelot, Mont Johnson
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601423
TOPICS: Ultrasonics, Phase velocity, Velocity measurements, Wave plates, Wave propagation, Interferometers, Signal detection, Laser energy, Phase measurement, Ultrasonography
Yanni Cao, Gerald Diebold
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601213
TOPICS: Photoacoustic spectroscopy, Optical spheres, Picosecond phenomena, Thermal effects, Acoustics, Liquids, Diffusion, Wave propagation, Spherical lenses, Optical engineering
Gianpiero Amato, Guiliana Benedetto, Luca Boarino, N. Brunetto, R. Spagnolo
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601214
TOPICS: Silicon, Picosecond phenomena, Absorption, Photoacoustic spectroscopy, Modulation, Crystals, Etching, Semiconducting wafers, Diffusion, Luminescence
Dragan Todorovic, P. Nikolic
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601215
TOPICS: Semiconductors, Diffusion, Absorption, Thin films, Modulation, Silicon, Germanium, Signal detection, Surface finishing, Polishing
Andreas Ehlert, Michael Kerstan, Holger Lundt, Anton Huber, Dieter Helmreich, Hans-Dieter Geiler, Harald Karge, Matthias Wagner
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601216
TOPICS: Semiconducting wafers, Luminescence, Silicon, Heterodyning, Modulation, Reflectivity, Semiconductors, Surface finishing, Optical engineering, Polishing
Andreas Mandelis, Marios Nestoros, Constantinos Christofides
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601217
TOPICS: Silicon, Semiconductors, Plasmas, Doping, Semiconductor lasers, Thermography, Semiconducting wafers, Transform theory, Optical engineering, Absorption
Bernd Seidel, Werner Faubel
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601218
TOPICS: Sensors, Chemical analysis, Laser beam diagnostics, Refractive index, Fiber lasers, Lamps, Optical fibers, Light sources, Chemical process control, Liquids
Leonid Dorojkine, Andreas Mandelis
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601219
TOPICS: Sensors, Hydrogen, Nitrogen, Chemical elements, Thin films, Capacitance, Electrodes, Signal detection, Palladium, Helium
Janos Sneider, Zoltan Bozoki, Gabor Szabo, Zsolt Bor
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601220
TOPICS: Absorption, Photoacoustic spectroscopy, Semiconductor lasers, Molecules, Light sources, Modulation, Gas lasers, Molecular lasers, Optical gas detection, Sensors
Joan Power
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601221
TOPICS: Inverse problems, Heat flux, Inverse optics, Error analysis, Optical engineering, Expectation maximization algorithms, Absorption, Data modeling, Chemical elements, Temperature metrology
Eberhard Welsch, K. Ettrich, Holger Blaschke, Peter Thomsen-Schmidt, Dieter Schaefer, Norbert Kaiser
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601222
TOPICS: Absorption, Ultraviolet radiation, Laser damage threshold, Thin films, Coating, Laser beam diagnostics, Mirrors, Multilayers, Aluminum, Quartz
Mario Bertolotti, G. Liakhou, Roberto Li Voti, A. Matera, Concita Sibilia, M. Valentino
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601223
TOPICS: Waveguides, Signal attenuation, Laser beam diagnostics, Wave propagation, Channel waveguides, Diffusion, Optical engineering, Absorption, Refractive index, Thermography
Joan Power, M. Schweitzer
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601225
TOPICS: Laser beam diagnostics, Diffraction, Detection theory, Signal detection, Sensors, Beam propagation method, Optical engineering, Near field optics, Near field, Profiling
Jean-Claude Kastelik, Marc Gazalet, F. Haine, Michel Pommeray
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601224
TOPICS: Acousto-optics, Acoustics, Crystals, Argon ion lasers, Laser crystals, Optical engineering, Two wave mixing, Light wave propagation, Birefringence, Laser video displays
Raji Mali, Thomas Bifano, Nelsimar Vandelli, Mark Horenstein
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601599
TOPICS: Actuators, Deformable mirrors, Mirrors, Microelectromechanical systems, Adaptive optics, Control systems, Imaging systems, Segmented mirrors, Silicon, Microactuators
Fei Ming Tong, Nuggehalli Ravindra, Walter Kosonocky
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601226
TOPICS: Error analysis, Reflectivity, Aluminum, Silicon, Metals, Transmittance, Tolerancing, Optical filters, Dielectric filters, Dielectrics
Raimo Silvennoinen, Mikhail Mozerov
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601227
TOPICS: Holograms, Integrated optics, 3D image reconstruction, Fresnel lenses, Information operations, Error analysis, Optical components, Computer generated holography, Wavefronts, Numerical simulations
Marija Strojnik, Gonzalo Paez
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601228
TOPICS: Cameras, Sensors, Imaging systems, Image resolution, Signal to noise ratio, Reconnaissance, Charge-coupled devices, Space operations, Optical resolution, Telescopes
Dimitrios Tzovaras, Nikos Grammalidis, Michael Strintzis
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601229
TOPICS: Cameras, Motion estimation, Stereoscopic cameras, Motion models, 3D modeling, 3D image processing, Feature extraction, Detection and tracking algorithms, Computer programming, Digital filtering
Chung-Woei Chao, Chaur-Heh Hsieh, Chung-Cheng Chiu, Po-Chiang Lu
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601230
TOPICS: Quantization, Fuzzy logic, Reconstruction algorithms, Algorithm development, Distortion, Optical engineering, Signal to noise ratio, Visualization, Data storage, Chaos
Dhruba Biswas, J. Nilaya, Udit Chatterjee
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601231
TOPICS: Seaborgium, Electrodes, Dielectrics, Switches, Gas lasers, Switching, Laser applications, Carbon monoxide, Optical sensors, Pulsed laser operation
Johan Burger, Pieter Swart, Stephanus Spammer, Pavel Bulkin
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601232
TOPICS: Fiber lasers, Reflectivity, Mirrors, Signal attenuation, Erbium, Fiber Bragg gratings, Absorption, Sensors, Laser damage threshold, Telecommunications
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601233
TOPICS: Sensors, Temperature metrology, Error analysis, Polarimetry, Fiber Bragg gratings, Phase measurement, Calibration, Optical engineering, Polarization maintaining fibers, Connectors
Henrik Saldner, Jonathan Huntley
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601234
TOPICS: Cameras, Projection systems, Spatial light modulators, Calibration, Fringe analysis, Phase measurement, Modulation, Distortion, Phase shift keying, Optical engineering
Marten de Vries
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601190
Optical Engineering, Vol. 36, Issue 02, (February 1997) https://doi.org/10.1117/1.601191
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