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Bin Liu
at Niigata Univ
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Publications (1)
Proceedings Article | 3 September 2019 Presentation + Paper
3D thickness measurement using pulse-driven optical coherence tomography based on wavelet transform
Takamasa Suzuki, Bin Liu, Samuel Choi
Proceedings Volume 11102, 111021A (2019) https://doi.org/10.1117/12.2534005
KEYWORDS: 3D metrology, Continuous wavelet transforms, Optical coherence tomography, Glasses, Continuous wave operation, Signal processing, Light sources, Signal detection, CCD cameras, Optical testing
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