Dr. Cong Yue
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 4 April 2023 Paper
Proceedings Volume 12617, 1261774 (2023) https://doi.org/10.1117/12.2666786
KEYWORDS: Sensors, Laser systems engineering, Laser interferometry, Calibration, Autocollimators, Metrology, Error control coding, Optical encoders, Lithium, Interpolation

Proceedings Article | 4 January 2023 Presentation + Paper
Proceedings Volume 12317, 1231717 (2023) https://doi.org/10.1117/12.2645581
KEYWORDS: Scanning electron microscopy, Electron microscopes, Technology, Standards development, Shape analysis, Error analysis, Transmission electron microscopy, Inspection, Image analysis, Metrology

Proceedings Article | 19 December 2022 Paper
Proceedings Volume 12319, 123190Q (2022) https://doi.org/10.1117/12.2645474
KEYWORDS: Particles, Scanning electron microscopy, Shape analysis, Electron microscopes, Atmospheric particles, 3D metrology, Laser applications, Image analysis, Error analysis, Transmission electron microscopy

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