Dr. Dennis IJpes
at Univ Twente
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 October 2024 Presentation
Igor Makhotkin, Marcelo Ackermann, Dennis IJpes, Jacobus Sturm, Andrey Yakshin
Proceedings Volume PC13150, PC1315002 (2024) https://doi.org/10.1117/12.3029912
KEYWORDS: Reflectivity, Interfaces, X-rays, Polishing, Multilayers, Ions, Tungsten, Barrier layers, X-ray optics, X-ray microscopy

Proceedings Article | 4 October 2024 Presentation
Igor Makhotkin, Adele Valpreda, Dennis IJpes, Atul Tiwari, Joachim Woitok, Jacobus Sturm, Andrey Yakshin, Marcelo Ackermann, Niek Lokhorst
Proceedings Volume PC13150, PC1315004 (2024) https://doi.org/10.1117/12.3029909
KEYWORDS: X-rays, Interfaces, Multilayers, Reflectivity, X-ray fluorescence spectroscopy, Mirrors, Data modeling, X-ray lithography, Metrology, X-ray optics

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