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Don M.J. van Elst
at Technische Univ. Eindhoven
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Publications (3)
Proceedings Article | 30 May 2022 Presentation
On-chip near-infrared spectral sensor for nondestructive material analysis
Anne van Klinken, Fang Ou, Chenhui Li, Don M. van Elst, Maurangelo Petruzzella, Kaylee Hakkel, Francesco Pagliano, Petar Sevo, René P. van Veldhoven, Andrea Fiore
Proceedings Volume PC12139, PC1213905 (2022) https://doi.org/10.1117/12.2620290
KEYWORDS: Sensors, Nondestructive evaluation, Near infrared, Chemical analysis, Photodetectors, Materials analysis, Spectrometers, Process control, Photodiodes, Visible radiation
Proceedings Article | 1 April 2022 Presentation
High-performance mid-infrared filter arrays for gas sensing
Kaylee Hakkel, Maurangelo Petruzzella, Martin Ebermann, Francesco Pagliano, Don M. van Elst, Anne van Klinken, Andrea Fiore
Proceedings Volume PC11997, PC119970B (2022) https://doi.org/10.1117/12.2606043
KEYWORDS: Mid-IR, Optical filters, Dielectric filters, Absorption, Pyroelectric detectors, Transmittance, Optical lithography, Molecules, Lithography, Fabry–Perot interferometers
Proceedings Article | 9 March 2022 Presentation
High-performance near-infrared spectral sensors based on a wafer-scale fabrication process
Don M. van Elst, Anne van Klinken, Fang Ou, Maurangelo Petruzzella, Kaylee Hakkel, Francesco Pagliano, René P. van Veldhoven, Andrea Fiore
Proceedings Volume PC12013, PC1201305 (2022) https://doi.org/10.1117/12.2605960
KEYWORDS: Sensors, Spectrometers, Chemical elements, Chemical analysis, Photodetectors, Optical resonators, Optical lithography, Optical components, Industrial chemicals, Chemometrics
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