Dr. Fang Ou Profile

Dr. Fang Ou

at Technische Univ Eindhoven

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Author

Publications (4)

Proceedings Article | 30 May 2022 Presentation

On-chip near-infrared spectral sensor for nondestructive material analysis

Anne van Klinken, Fang Ou, Chenhui Li, Don M. van Elst, Maurangelo Petruzzella, Kaylee Hakkel, Francesco Pagliano, Petar Sevo, René P. van Veldhoven, Andrea Fiore

Proceedings Volume PC12139, PC1213905 (2022) https://doi.org/10.1117/12.2620290

KEYWORDS: Sensors, Nondestructive evaluation, Near infrared, Chemical analysis, Photodetectors, Materials analysis, Spectrometers, Process control, Photodiodes, Visible radiation

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Proceedings Article | 9 March 2022 Presentation

High-performance near-infrared spectral sensors based on a wafer-scale fabrication process

Don M. van Elst, Anne van Klinken, Fang Ou, Maurangelo Petruzzella, Kaylee Hakkel, Francesco Pagliano, René P. van Veldhoven, Andrea Fiore

Proceedings Volume PC12013, PC1201305 (2022) https://doi.org/10.1117/12.2605960

KEYWORDS: Sensors, Spectrometers, Chemical elements, Chemical analysis, Photodetectors, Optical resonators, Optical lithography, Optical components, Industrial chemicals, Chemometrics

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Proceedings Article | 18 April 2021 Presentation

Integrated NIR spectral sensor based on an array of resonant-cavity enhanced detectors

Anne van Klinken, Maurangelo Petruzzella, Kaylee Hakkel, Fang Ou, Francesco Pagliano, Tianran Liu, René P. van Veldhoven, Andrea Fiore

Proceedings Volume 11772, 117720G (2021) https://doi.org/10.1117/12.2589233

KEYWORDS: Sensors, Near infrared, Metals, Chemical analysis, Biological and chemical sensing, Wafer bonding, Visible radiation, Tissues, Spectral resolution, Silicon

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Spectral sensing in the near-infrared range is of increasing interest for application areas ranging from industrial processes to the agri-food sector, as it allows measuring the chemical composition of organic materials in a fast and non-destructive manner. On-field applications demand spectral sensors with a large spectral range, low angular dependence, robust geometry and small footprint, while being manufacturable on large scale at low cost. To meet these requirements, we developed a multi-pixel array of resonant-cavity enhanced detectors using an InP-membrane-on-silicon platform, where each of the 16 pixels provides an individual photoresponse with a number of resonances, which together cover the wavelength range of 800-1700 nm. The pixels consist of two metal mirrors, which enclose an InP p-i-n photodiode with an InGaAs absorber layer and a tuning layer, which varies in thickness to create the individual photoresponses of different pixels. The multi-pixel arrays are fabricated by adhesive wafer bonding followed by a series of lithography steps to define the tuned pixels and metal contacts for the photocurrent read-out. Despite the limited number of measurement channels with broad spectral response, information on the chemical composition of the sample can be directly retrieved using chemometrics. The sensing capabilities for our spectral sensors are demonstrated with two practical application cases: determination of the nutritional information in raw milk and the classification of different plastic types. For both experiments, the photocurrent measurements from the sensor were used directly in regression or classification algorithms based on partial least squares analysis, leading to convincing prediction performance. This shows that the fabricated spectral sensor can retrieve chemical information for a broad set of sensing problems. Simulations have shown that for a specific sensing problem the prediction performance of the spectral sensor can be further improved by an optimized selection of the available spectral responses.

Proceedings Article | 5 March 2021 Presentation

An integrated near-infrared spectral chip for on-field sensing

Kaylee Hakkel, Maurangelo Petruzzella, Fang Ou, Anne van Klinken, Francesco Pagliano, Tianran Liu, Rene van Veldhoven, Andrea Fiore

Proceedings Volume 11682, 1168218 (2021) https://doi.org/10.1117/12.2577548

KEYWORDS: Sensors, Wafer-level optics, Spectrometers, Short wave infrared radiation, Point-of-care devices, Photodetectors, Optical filters, Optical components, Near infrared spectroscopy, Interferometers

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