Jong-Cheol Choi
at ASML Korea Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 March 2019 Presentation + Paper
Ik-Hyun Jeong, Hyun-Sok Kim, Yeong-Oh Kong, Ji-Hyun Song, Jae-Wuk Ju, Young-Sik Kim, Cees Lambregts, Miao Yu, Rizvi Rahman, Leendertjan Karssemeijer, Elliott McNamara, Paul Böcker, Jong-Cheol Choi, Nang-Lyeom Oh, Kang-San Lee, Jin-Seo Lee
Proceedings Volume 10961, 109610A (2019) https://doi.org/10.1117/12.2516259
KEYWORDS: Optical alignment, Semiconducting wafers, Calibration, Data modeling, Overlay metrology, Metrology, Scanners, High volume manufacturing, Lithography, Sensors

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