Dr. Karen Ribaud
at CEA-LETI
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 5 March 2022 Presentation + Paper
Q. Wilmart, S. Guerber, J. Faugier-Tovar, Yasmine Ibrahimi, Camille Petit-Etienne, Laurene Youssef, Carole Socquet-Clerc, André Myko, Karen Ribaud, François Duport, Erwine Pargon, Frédéric Van Dijk
Proceedings Volume 12006, 120060D (2022) https://doi.org/10.1117/12.2606853
KEYWORDS: Waveguides, Silicon, Semiconducting wafers, Wave propagation, Resonators, Fiber couplers, Multiplexers, Silicon photonics, Directional couplers

Proceedings Article | 5 March 2021 Presentation + Paper
I. Charlet, L. Deniel, P. Acosta-Alba, Y. Désières, S. Guerber, S. Kerdilès, J. Lassarre, C. Perrot, C. Euvrard-Colnat, K. Ribaud, P. Grosse, M. Gregoire, K. Rovayaz, L. Mazet, S. Cremer, N. Vulliet, S. Monfray, S. Messaoudène, D. Marris-Morini, F. Boeuf
Proceedings Volume 11691, 116910R (2021) https://doi.org/10.1117/12.2577806
KEYWORDS: Modulators, Silicon, Annealing, Silicon photonics, Waveguides, Transmitters, Transceivers, Oxides, Optoelectronics

Proceedings Article | 5 March 2021 Presentation + Paper
C. Barrera, S. Guerber, D. Fowler, S. Monfray, A. Montagne, A. Myko, P. Grosse, K. Ribaud, P. Lemaitre, S. Cremer, I. Charlet, L. Vivien, F. Boeuf
Proceedings Volume 11690, 1169007 (2021) https://doi.org/10.1117/12.2582776
KEYWORDS: Phased array optics, Silicon, Waveguides, Modulators, LIDAR, Free space optics, Telecommunications, System integration, Spatial resolution, Solid state electronics

Proceedings Article | 26 February 2020 Paper
Quentin Wilmart, Thomas Mang, Daivid Fowler, Stéphane Brision, Karen Ribaud, Stéphane Malhouitre, Stéphane Bernabé, Corrado Sciancalepore, Bertrand Szelag, Ségolène Olivier
Proceedings Volume 11285, 112850B (2020) https://doi.org/10.1117/12.2543748
KEYWORDS: Silicon, Waveguides, Polarization, Photonics, Etching, Coarse wavelength division multiplexing, Silicon photonics, Transceivers, Data communications, Semiconducting wafers

Proceedings Article | 22 February 2018 Presentation + Paper
Cyril Bellegarde, Erwine Pargon, Corrado Sciancalepore, Camille Petit-Etienne, Olivier Lemonnier, Karen Ribaud, Jean-Michel Hartmann, Philippe Lyan
Proceedings Volume 10537, 1053706 (2018) https://doi.org/10.1117/12.2289564
KEYWORDS: Annealing, Waveguides, Silicon, Line edge roughness, Optical lithography, Atomic force microscopy, Scanning electron microscopy, Interfaces, Wave propagation, Photomasks

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