Dr. Kyeong Dong Park
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 2 April 2014 Paper
Proceedings Volume 9050, 90502F (2014) https://doi.org/10.1117/12.2046235
KEYWORDS: Semiconducting wafers, Scanners, Finite element methods, Monochromatic aberrations, Control systems, Error analysis, Code division multiplexing, Critical dimension metrology, Process control, Sensors

Proceedings Article | 2 April 2014 Paper
Proceedings Volume 9050, 90500R (2014) https://doi.org/10.1117/12.2046224
KEYWORDS: Semiconducting wafers, Metrology, Reticles, Signal processing, Control systems, Lithography, Scanners, Process control, Scanning electron microscopy, Computer simulations

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