Prof. Larry V. Knight
Professor Emeritus at Brigham Young Univ
SPIE Involvement:
Author
Publications (19)

Proceedings Article | 10 September 2005 Paper
Alexander Shevelko, Edward Boyle, Sergei Ashitkov, Vladimir Fortov, Nikolay Andreev, Mikhail Agranat, Larry Knight, Andrey Ovchinnikov, Dmitry Sitnikov
Proceedings Volume 5918, 59180O (2005) https://doi.org/10.1117/12.619631
KEYWORDS: X-rays, Spectrometers, Crystals, Pulsed laser operation, Copper, Plasmas, Optical amplifiers, Hard x-rays, Iron, Femtosecond phenomena

Proceedings Article | 10 September 2005 Paper
M. Asplund, T. Weeks, J. Ellsworth, L. Knight, M. Harrison, M. Johnson, A. Shevelko, S. Bergeson
Proceedings Volume 5918, 59180R (2005) https://doi.org/10.1117/12.619632
KEYWORDS: Plasmas, Spectroscopy, X-rays, Calibration, Mica, Charge-coupled devices, Magnesium, Crystals, Spectral calibration, X-ray lasers

Proceedings Article | 7 January 2004 Paper
D. Clark Turner, Alexander Shevelko, R. Steven Turley, Oleg Yakushev, Larry Knight, Yuri Kasyanov, James Phillips
Proceedings Volume 5196, (2004) https://doi.org/10.1117/12.507723
KEYWORDS: Spectroscopy, X-rays, Crystals, Plasma, Extreme ultraviolet, Charge-coupled devices, Capillaries, Sensors, Spectral resolution, Spectrographs

Proceedings Article | 23 October 2002 Paper
Larry Knight, Alexander Shevelko, Israel Beigman
Proceedings Volume 4781, (2002) https://doi.org/10.1117/12.450461
KEYWORDS: Ions, X-rays, Optical filters, Plasmas, Crystals, Calibration, Absorption filters, X-ray detectors, Absorption, Satellites

Proceedings Article | 25 January 2002 Paper
A. Stradling, S. Cornaby, Paul Moody, Larry Knight, T. Grow, Arturo Reyes-Mena, T. Hughes
Proceedings Volume 4497, (2002) https://doi.org/10.1117/12.454227
KEYWORDS: Charge-coupled devices, X-rays, X-ray detectors, X-ray diffraction, Diffraction, X-ray fluorescence spectroscopy, Sensors, X-ray sources, Mars, CCD image sensors

Showing 5 of 19 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 12 August 1986

Conference Committee Involvement (1)
X-Ray Imaging II
1 August 1986 | San Diego, United States
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