Noam Oved
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 16 April 2024 Presentation + Paper
Il Hwan Kim, Cheolgyu Hyun, Sangho Jo, Muyoung Lee, Ikjun Jang, Jongsu Kim, Jinhong Park, Yigwon Kim, Chang Min Park, Kevin Houchens, Jenny Perry, Nahum Bomshtein, Liad Anokov, Noam Oved, Uri Smolyan, Michael Shifrin, Tal Itzkovich, Jeong Ho Yeo, You Jin Kim, Baek Jun Kim
Proceedings Volume 12955, 129551I (2024) https://doi.org/10.1117/12.3010511
KEYWORDS: Design, Scanning electron microscopy, Overlay metrology, Monte Carlo methods, Electrons, Lithography, Precision measurement, Electron beam lithography, Design rules, Signal detection

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 129550N (2024) https://doi.org/10.1117/12.3010831
KEYWORDS: Metrology, Overlay metrology, Scanning electron microscopy, Semiconducting wafers, Critical dimension metrology, Metals, High volume manufacturing, Contour extraction, Computer aided design, Design

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