Dr. Tomas Peach Profile

Dr. Tomas Peach

at Cardiff Univ

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 17 March 2023 Presentation

Optical studies of implanted bismuth impurities in silicon towards single/few impurity devices

Steven Clowes, Benedict Murdin, Kristian Stockbridge, Tomas Peach, Nils Dressman

Proceedings Volume PC12430, PC124300W (2023) https://doi.org/10.1117/12.2649091

KEYWORDS: Bismuth, Silicon, Ion implantation, Terahertz radiation, Quantum communications, Optics manufacturing, Microelectronics, Manufacturing, Magnetism, Ions

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Proceedings Article | 25 May 2022 Presentation

Impact of strain-induced bow on the performance of VCSELs on 150mm GaAs- and Ge-substrate wafers

Jack Baker, Sara Gillgrass, Tomas Peach, Craig Allford, J. Iwan Davies, Andrew Johnson, Andrew Joel, Sung Wook Lim, Samuel Shutts, Peter Smowton

Proceedings Volume PC12141, PC1214108 (2022) https://doi.org/10.1117/12.2624492

KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Gallium arsenide, Germanium, Oxides, Oxidation, Manufacturing, Surface finishing, Statistical analysis, Polishing

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Proceedings Article | 9 March 2022 Presentation

Sub-mA threshold current quick fabrication VCSELs for characterisation of epitaxial material over 150mm wafers

Jack Baker, Craig Allford, Sara Gillgrass, Tomas Peach, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12020, PC1202007 (2022) https://doi.org/10.1117/12.2610179

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Measurement devices, Reflectometry, Oxides, Oxidation, Bridges

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Proceedings Article | 5 March 2021 Presentation

Quick fabrication of 940nm emitting VCSEL arrays for commercial wafer characterization

Jack Baker, David Hayes, Tomas Peach, Sara Gillgrass, Craig Allford, Curtis Hentschel, Angela Sobiesierski, Connie Eng, Saleem Shabbir, Stuart Thomas, Clive Meaton, Aidan Daly, Tracy Sweet, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume 11704, 1170408 (2021) https://doi.org/10.1117/12.2578365

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Thermal oxidation, Manufacturing, Calibration

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Proceedings Article | 5 March 2021 Presentation

150mm full wafer fabrication and characterization of 940nm emitting VCSELs for high-volume manufacture

David Hayes, Tomas Peach, Jack Baker, Sara-Jayne Gillgrass, Craig Allford, Angela Sobiesierski, Connie Eng, Saleem Shabbir, Stuart Thomas, Curtis Hentschel, Clive Meaton, Samuel Shutts, Aidan Daly, Tracy Sweet, Iwan Davies, Peter Smowton

Proceedings Volume 11704, 1170406 (2021) https://doi.org/10.1117/12.2578592

KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Manufacturing, Wafer testing, Thermal oxidation, Reflectivity, Photoresist materials, Oxides, Electro optics, Analytical research

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