Mr. Jack Baker Profile

Jack Baker

at Cardiff Univ

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 13 March 2024 Presentation

Effect of Ge-substrate thickness on 940-nm VCSEL performance

Sara-Jayne Gillgrass, Craig Allford, Jack Baker, Andrew Johnson, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12904, PC1290408 (2024) https://doi.org/10.1117/12.3001658

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Manufacturing, Reliability, Photovoltaics, Industry, High volume manufacturing, Gallium arsenide, Fabrication, Chip manufacturing

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Proceedings Article | 17 March 2023 Presentation

Design and characterisation of VCSELs for atomic sensor applications

Samuel Shutts, Curtis Hentschel, Sara-Jayne Gillgrass, James Meiklejohn, Craig Allford, Jack Baker, Josie Nabialek, Denise Powell, Witold Chalupczak, Mohsin Haji, Wyn Meredith, Peter Smowton

Proceedings Volume PC12439, PC1243907 (2023) https://doi.org/10.1117/12.2650495

KEYWORDS: Vertical cavity surface emitting lasers, Sensors, Quantum wells, Optical pumping, Ytterbium, Temperature metrology, Strontium, Spectroscopes, Second-harmonic generation, Mirrors

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Proceedings Article | 17 March 2023 Presentation

Quick fabrication VCSEL characterisation for rapid assessment of epitaxy design and growth

Craig Allford, Jack Baker, Sara-Jayne Gillgrass, James Meiklejohn, Denise Powell, Wyn Meredith, Tracy Sweet, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12439, PC124390C (2023) https://doi.org/10.1117/12.2648742

KEYWORDS: Vertical cavity surface emitting lasers, Epitaxy, Semiconducting wafers, Wavelength tuning, Wafer-level optics, Temperature metrology, Structural design, Spectrographs, Oxidation, Integrating spheres

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Proceedings Article | 17 March 2023 Presentation

Characterisation of 200 mm GaAs and Ge substrate VCSELs for high-volume manufacturing

Sara-Jayne Gillgrass, Craig Allford, Andrew Johnson, Jack Baker, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12439, PC124390B (2023) https://doi.org/10.1117/12.2648442

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, High volume manufacturing, Manufacturing, Gallium arsenide, Germanium, Three dimensional sensing, Reliability, Crystals

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Proceedings Article | 25 May 2022 Presentation

Impact of strain-induced bow on the performance of VCSELs on 150mm GaAs- and Ge-substrate wafers

Jack Baker, Sara Gillgrass, Tomas Peach, Craig Allford, J. Iwan Davies, Andrew Johnson, Andrew Joel, Sung Wook Lim, Samuel Shutts, Peter Smowton

Proceedings Volume PC12141, PC1214108 (2022) https://doi.org/10.1117/12.2624492

KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Gallium arsenide, Germanium, Oxides, Oxidation, Manufacturing, Surface finishing, Statistical analysis, Polishing

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Proceedings Article | 9 March 2022 Presentation

Sub-mA threshold current quick fabrication VCSELs for characterisation of epitaxial material over 150mm wafers

Jack Baker, Craig Allford, Sara Gillgrass, Tomas Peach, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12020, PC1202007 (2022) https://doi.org/10.1117/12.2610179

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Measurement devices, Reflectometry, Oxides, Oxidation, Bridges

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Proceedings Article | 5 March 2021 Presentation

150mm full wafer fabrication and characterization of 940nm emitting VCSELs for high-volume manufacture

David Hayes, Tomas Peach, Jack Baker, Sara-Jayne Gillgrass, Craig Allford, Angela Sobiesierski, Connie Eng, Saleem Shabbir, Stuart Thomas, Curtis Hentschel, Clive Meaton, Samuel Shutts, Aidan Daly, Tracy Sweet, Iwan Davies, Peter Smowton

Proceedings Volume 11704, 1170406 (2021) https://doi.org/10.1117/12.2578592

KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Manufacturing, Wafer testing, Thermal oxidation, Reflectivity, Photoresist materials, Oxides, Electro optics, Analytical research

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Proceedings Article | 5 March 2021 Presentation

Quick fabrication of 940nm emitting VCSEL arrays for commercial wafer characterization

Jack Baker, David Hayes, Tomas Peach, Sara Gillgrass, Craig Allford, Curtis Hentschel, Angela Sobiesierski, Connie Eng, Saleem Shabbir, Stuart Thomas, Clive Meaton, Aidan Daly, Tracy Sweet, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume 11704, 1170408 (2021) https://doi.org/10.1117/12.2578365

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Thermal oxidation, Manufacturing, Calibration

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Showing 5 of 8 publications

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