Prof. Valentinas J. Snitka Profile

Prof. Valentinas J. Snitka

at Kaunas Univ of Technology

SPIE Involvement:

Author

Publications (10)

Proceedings Article | 29 March 2004 Paper

Atomic force microscopy investigation of supramolecular self-assembly of the porphyrin nanotubules

Valentinas Snitka, Raminta Rodaite, Arturas Ulcinas, Vida Mizariene

Proceedings Volume 5275, (2004) https://doi.org/10.1117/12.522797

KEYWORDS: Atomic force microscopy, Acoustic cavitation, Ultraviolet radiation, Temperature metrology, Microwave radiation, Cavitation, Silicon, Medium wave, Absorption, Absorption spectroscopy

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Proceedings Article | 10 April 2001 Paper

Structure investigation of luminescent porous GaAs layers

Rimgaudas Bendorius, Vytautas Jasutis, Vaidas Pacebutas, J. Sabataityte, Valentinas Snitka, I. Simkiene, H. Tvardauskas

Proceedings Volume 4415, (2001) https://doi.org/10.1117/12.425477

KEYWORDS: Gallium arsenide, Etching, Luminescence, Infrared radiation, Arsenic, Oxides, Scanning electron microscopy, Gallium, Ions, Electrochemical etching

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Proceedings Article | 6 April 2001 Paper

Materials surface topography and composition imaging using dynamic atomic force microscopy

Valentinas Snitka, Vida Mizariene, Arturas Ulcinas

Proceedings Volume 4234, (2001) https://doi.org/10.1117/12.424416

KEYWORDS: Atomic force microscopy, Scanning probe microscopy, Modulation, Microscopes, Phase shifts, Silicon, Phase shift keying, Scanning tunneling microscopy, Nanotechnology, Calibration

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Proceedings Article | 16 March 2001 Paper

State-of-the-art ultrasonic micromotors and their future applications

Valentinas Snitka, Vida Mizariene

Proceedings Volume 4236, (2001) https://doi.org/10.1117/12.418771

KEYWORDS: Ultrasonics, Actuators, Microelectromechanical systems, Electromagnetism, Performance modeling, Analytical research, Tolerancing

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Proceedings Article | 30 January 2001 Paper

Laser-pulse-induced chemical reactions and surface patterning in Co-Si and Co-Ti-Si films: investigations by x-ray diffraction and atomic force microscopy

Maris Knite, Leonids Shebanov, Valentinas Snitka

Proceedings Volume 4157, (2001) https://doi.org/10.1117/12.413758

KEYWORDS: X-ray diffraction, Silicon, Atomic force microscopy, Laser crystals, Resistance, Crystals, Carbon dioxide lasers, Pulsed laser operation, Photomicroscopy, Metals

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Proceedings Article | 10 April 2000 Paper

Surface investigation of porous GaAs used for luminescent films

Valentinas Snitka, I. Simkiene, K. Grigoras, Vytautas Jasutis, Kestutis Naudzius, Vaidas Pacebutas, J. Sabataityte, Vida Mizariene

Proceedings Volume 4019, (2000) https://doi.org/10.1117/12.382323

KEYWORDS: Gallium arsenide, Luminescence, Etching, Chemical analysis, Arsenic, Oxides, Infrared radiation, Crystals, Atomic force microscopy, Argon ion lasers

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Proceedings Article | 7 May 1999 Paper

Laser-induced modifications of binary Co-Si and ternary Co-Ti-Si films

Maris Knite, Valentinas Snitka, Arthur Medvids

Proceedings Volume 3571, (1999) https://doi.org/10.1117/12.347651

KEYWORDS: Silicon, Resistance, Cobalt, Crystals, Titanium, Atomic force microscopy, Carbon dioxide lasers, Temperature metrology, Laser therapeutics, Laser crystals

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Proceedings Article | 10 March 1999 Paper

Numeric investigation of vibrating microcantilever using Matlab/Simulink

Arturas Ulcinas, Valentinas Snitka, Mindaugas Rackaitis

Proceedings Volume 3680, (1999) https://doi.org/10.1117/12.341222

KEYWORDS: Scanning probe microscopy, MATLAB, Motion models, Simulink, Computer simulations, Sensors, Systems modeling, Surface properties, Mechanics, Complex systems

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Proceedings Article | 10 March 1999 Paper

Characterization of porous silicon for solar cell application by atomic force microscopy

I. Simkiene, Valentinas Snitka, Kestutis Naudzius, Vaidas Pacebutas, Mindaugas Rackaitis

Proceedings Volume 3680, (1999) https://doi.org/10.1117/12.341190

KEYWORDS: Silicon, Picosecond phenomena, Solar cells, Atomic force microscopy, Etching, Semiconducting wafers, Diffusion, Glasses, Surface roughness, Electrochemical etching

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Proceedings Article | 1 June 1998 Paper

Vibration measurement by atomic force microscopy with laser readout

Valentinas Snitka, Vida Mizariene, Margiris Kalinauskas, Paulius Lucinskas

Proceedings Volume 3411, (1998) https://doi.org/10.1117/12.307752

KEYWORDS: Atomic force microscopy, Vibrometry, Data storage, Phase shifts, Sensors, Ultrasonics, Photodetectors, Oscilloscopes, Acoustics, Transducers

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Showing 5 of 10 publications

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