Ga-free InAs/InAsSb type-II superlattice (T2SL) nBn photodetectors with very low dark current are fabricated and
characterized. The typical device without antireflection coating and surface passivation has a cut-off wavelength of 13.2
micrometers, quantum efficiency (QE) of 2.5% and a background limited operating temperature of 70 K. Our analysis
shows that the anticipated highest operating temperature of a 10.6 micrometer cut-off Ga-free T2SL nBn device can be
108 K, with a potential to reach 135 K if 20% QE or lower noise is achieved.
Optical and structural properties of InAs/InAsSb type-II superlattices (T2SL) and their feasibility for mid- and longwavelength
infrared (MWIR and LWIR) photodetector applications are investigated. The InAs/InAsSb T2SL structures
with a broad bandgap range covering 4 μm to 12 μm are grown by molecular beam epitaxy and characterized by highresolution
x-ray diffraction and photoluminescence (PL) spectroscopy. All of the samples have excellent structural
properties and strong PL signal intensities of the same order of magnitude, indicating that non-radiative recombination is
not dominant and the material system is promising for high performance MWIR and LWIR detectors and multiband
FPAs.
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