Paper
11 July 2000 Hysteresis effect of pH-ISFET based on Beckman Φ 110 (Si3N4 gate pH-ISFET)
Jung Chuan Chou, Yu Neng Tseng
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Abstract
In this study, the commercial manufacture Beckman 110 (Si3N4 gate pH-ISFET) was acted as the sensitive membrane of pH-ISFET. The experimental results show that the Si3N4 material has a fairly high response, and the pH sensitivity was obtained at 56.94 mV/pH in a concentration rage between pH 1 and pH 11 at room temperature. In our experiment, we use Keithley 236 Semiconductor Parameter Analyzer to measure the drain current (IDS) versus gate voltage (VG) curve of Si3N4 ISFET over a pH range from 1 to 11 at room temperature. The constant voltage-current-circuit and time-voltage record were also used to measure the hysteresis curve of Beckman 110 (Si3N4 gate pH-ISFET). The same procedure was also applied to a-Si:H gate pH-ISFET, which fabricated in our laboratory. From the IDS versus VG and hysteresis curve, we can obtain that the pH sensitivity was 56.94 mV/pH at constant temperature (25 degree(s)C) and hysteresis widths of Beckman 110 (Si3N4 gate pH-ISFET) and a- Si:H gate pH-ISFET in the larger pH site are larger than in the smaller pH site, and the hysteresis width increased with the increasing loop time and measureing path.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jung Chuan Chou and Yu Neng Tseng "Hysteresis effect of pH-ISFET based on Beckman Φ 110 (Si3N4 gate pH-ISFET)", Proc. SPIE 4078, Optoelectronic Materials and Devices II, (11 July 2000); https://doi.org/10.1117/12.392124
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KEYWORDS
Field effect transistors

Manufacturing

Temperature metrology

Electrodes

Ions

Silicon

Time metrology

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