Dr. Christian Gollwitzer Profile

Dr. Christian Gollwitzer

at Physikalisch-Technische Bundesanstalt

SPIE Involvement:

Author

Publications (6)

SPIE Journal Paper | 24 January 2024 Open Access

Multi-technique investigation of silicon nitride/aluminum membranes as optical blocking filters for high-energy space missions

Luisa Sciortino, Marco Barbera, Salvatore Ferruggia Bonura, Michela Todaro, Elena Puccio, Fabio D’Anca, Ugo Lo Cicero, Pekka T. Törmä, Elena Magnano, Silvia Nappini, Igor Píš, Emanuele Perinati, Sebastian Diebold, Alejandro Guzman, Chris Tenzer, Gianpiero Buscarino, Christian Gollwitzer, Evelyn Handick, Michael Krumrey, Christian Laubis, Roberto Candia, Salvatore Varisco

JATIS, Vol. 10, Issue 01, 018002, (January 2024) https://doi.org/10.1117/12.10.1117/1.JATIS.10.1.018002

KEYWORDS: Aluminum, Tunable filters, Silicon, Silicon nitride, X-rays, Optical filters, X-ray photoelectron spectroscopy, Oxides, Ultraviolet radiation, Visible radiation

Read Abstract +

DOWNLOAD PAPER

Proceedings Article | 31 August 2022 Presentation + Paper

Dopamine dip-liquid overcoatings for soft x-ray reflectivity enhancement

Vincenzo Cotroneo, Giacomo Rivolta, Marcos Bavdaz, Ricardo Bruni, Marta Civitani, Thorsten Döhring, Ivo Ferreira, Eugenio Gibertini, Angelo Giglia, Christian Gollwitzer, Simone Iovenitti, Michael Krumney, Luca Magagnin, Nicola Mahne, Stefano Nannarone, Giovanni Pareschi, Suzanne Romaine, Leandra Sethares, Brian Shortt, Dieter Skroblin, Giorgia Sironi, Daniele Spiga, Gianpiero Tagliaferri, Giuseppe Valsecchi

Proceedings Volume 12181, 1218117 (2022) https://doi.org/10.1117/12.2630212

KEYWORDS: Reflectivity, Chromium, X-rays, Mirrors, Optical coatings, Iridium, Gold, Data modeling, Deposition processes, X-ray telescopes, Sputter deposition, Polymer thin films, Thin films

Read Abstract +

Proceedings Article | 31 August 2022 Poster + Paper

Coating process parameter influence on thin films for the ATHENA x-ray optics

S. Massahi, D. D. Ferreira, F. Christensen, S. Svendsen, N. Gellert, A. 'S Jegers, M. Collon, B. Landgraf, A. Thete, I. Ferreira, M. Bavdaz, B. Shortt, W. Schönberger, A. Langer, M. Krumrey, C. Gollwitzer, E. Handick

Proceedings Volume 12181, 121814F (2022) https://doi.org/10.1117/12.2630726

KEYWORDS: Coating, Thin films, Iridium, Thin film coatings, Silicon, Boron, Data modeling, Thin film deposition, Chemical species, Silicon films

Read Abstract +

Proceedings Article | 31 August 2022 Presentation + Paper

Characterisation of iridium and low-density bilayer coatings for the Athena optics

S. Svendsen, S. Massahi, D. Ferreira, N. Gellert, A. 'S Jegers, F. Christensen, A. Thete, B. Landgraf, M. Collon, E. Handick, D. Skroblin, L. Cibik, C. Gollwitzer, M. Krumrey, I. Ferreira, B. Shortt, M. Bavdaz

Proceedings Volume 12181, 121810Z (2022) https://doi.org/10.1117/12.2629976

KEYWORDS: Thin film coatings, Annealing, X-rays, Thin films, Mirrors, Silicon carbide, Silicon, Iridium, Grazing incidence

Read Abstract +

Proceedings Article | 31 August 2022 Poster + Paper

Carbon nanotubes thin filters for x-ray detectors in space

Marco Barbera, Ugo Lo Cicero, Luisa Sciortino, Michela Todaro, Elena Puccio, Fabio D'Anca, Nicola Montinaro, Salvatore Varisco, Pekka Törmä, Lauri Riuttanen, Ilkka Varjos, Bjorn Mikladal, Elena Magnano, Igor Pis, Christian Gollwitzer, Evelyn Handick, Michael Krumrey, Christian Laubis

Proceedings Volume 12181, 121814H (2022) https://doi.org/10.1117/12.2631516

KEYWORDS: Aluminum, X-rays, Pellicles, Transmittance, Oxides, Optical filters, X-ray detectors, Manufacturing

Read Abstract +

Proceedings Article | 23 August 2021 Presentation + Paper

Impact of annealing on performance of X-ray mirror coatings for Athena

P. Henriksen, D. D. Ferreira, S. Massahi, S. Svendsen, N. Gellert, F. Christensen, A. Jegers, B. Landgraf, A. Thete, M. Collon, E. Handick, L. Cibik, M. Krumrey, C. Gollwitzer, I. Ferreira, B. Shortt, M. Bavdaz

Proceedings Volume 11822, 118220D (2021) https://doi.org/10.1117/12.2594559

KEYWORDS: Annealing, Reflectivity, X-rays, Mirrors, Data modeling, Scattering, Silicon, Silicon carbide, Reflectometry

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years