Hung-Ming Lin
Deputy Director at Powerchip Semiconductor Manufacturing Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 11 April 2008 Paper
Chan-Tsun Wu, Hung Ming Lin, Wei-Ming Wu, Meng-Hsun Chan, Benjamin Lin, Kuan-Heng Lin, Andrew Hazelton, Toshio Ohhashi, Katsushi Nakano, Yasuhiro Iriuchijima, Chunhsin Lee, Long Hung
Proceedings Volume 6924, 69241A (2008) https://doi.org/10.1117/12.772448
KEYWORDS: Photoresist materials, Semiconducting wafers, Particles, Scanners, Line width roughness, Immersion lithography, Lithography, Critical dimension metrology, Coating, Defect inspection

Proceedings Article | 24 March 2008 Paper
Hung Ming Lin, Benjamin Lin, James Wu, Smixer Chiu, Chin-Chou Kevin Huang, James Manka, Desmond Goh, Healthy Huang, David Tien
Proceedings Volume 6922, 69222R (2008) https://doi.org/10.1117/12.772118
KEYWORDS: Semiconducting wafers, Scanners, Overlay metrology, Control systems, Manufacturing, Metrology, Data modeling, Process control, Semiconductors, Optical alignment

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