Dr. Hyung-Jong Ko
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 27 April 2023 Presentation + Paper
Proceedings Volume 12496, 124961N (2023) https://doi.org/10.1117/12.2656206
KEYWORDS: Semiconducting wafers, Defect inspection, Inspection, Yield improvement, Failure analysis, Electrical breakdown, Semiconductors, Manufacturing, Logic, Image classification

Proceedings Article | 26 May 2022 Poster + Paper
Proceedings Volume 12053, 120531N (2022) https://doi.org/10.1117/12.2605606
KEYWORDS: Scanning electron microscopy, Optical inspection, Defect detection, Image segmentation, Inspection, Image processing algorithms and systems, Image enhancement, Design for manufacturing, Defect inspection, Visualization

Proceedings Article | 26 May 2022 Presentation + Paper
Proceedings Volume 12052, 120520B (2022) https://doi.org/10.1117/12.2613625
KEYWORDS: Data modeling, Machine learning, Performance modeling, Optical proximity correction, Bridges

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