Ms. Seung-Eun Yu Profile

Seung-Eun Yu

at SAMSUNG Electronics Co., Ltd.

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Publications (1)

Proceedings Article | 26 May 2022 Poster + Paper

An automated system for detecting systematic defect in memory cell array

Ji-Seong Jeong, Chang-Hun Ko, Seung-Eun Yu, Oh-Hun Kwon, Tae-Hyeong Ku, Tae-Heon Kim, Dong-Won Lim, Bo-Tak Lim, Hyuck-Joon Kwon, Jung-Yun Choi, Hyung-Jong Ko

Proceedings Volume 12053, 120531N (2022) https://doi.org/10.1117/12.2605606

KEYWORDS: Scanning electron microscopy, Optical inspection, Defect detection, Image segmentation, Inspection, Image processing algorithms and systems, Image enhancement, Design for manufacturing, Defect inspection, Visualization

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