Prof. Igor M. Fodchuk Profile

Prof. Igor M. Fodchuk

at CHNU

SPIE Involvement:

Author

Publications (34)

Proceedings Article | 5 January 2024 Paper

Paper

The influence of the transition layer of CdTe:Cl/MoOx heterostructures on the electrical and spectroscopic properties of detector systems

I. Fodchuk, A. Kuzmin, S. Balovsyak, I. Hutsuliak, M. Solodkyi, O. Maslynchuk

Proceedings Volume 12938, 129382H (2024) https://doi.org/10.1117/12.3015878

KEYWORDS: Heterojunctions, Crystals, Deformation, Spectroscopy, Electrical properties, X-rays, Molybdenum, Oxides, Sputter deposition, Scattering

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Proceedings Article | 5 January 2024 Paper

Paper

Investigation of the defect structure of high-resistance CdTe single crystals by the methods of high-resolution x-ray diffractometry and total integral reflective power

I. Fodchuk, A. Kuzmin, V. Dovganyuk, S. Balovsyak, I. Hutsuliak, M. Solodkyi, D. Makotiak, O. Tkach

Proceedings Volume 12938, 129382G (2024) https://doi.org/10.1117/12.3015876

KEYWORDS: Crystals, X-rays, X-ray diffraction, Systems modeling, Scattering, Reflection, Diffraction, Cadmium telluride, Statistical analysis

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Proceedings Article | 5 January 2024 Paper

Paper

Local distribution of strains in synthetic diamond crystals determined by the energy spectrum normalized parameters

I. Fodchuk, M. Solodkyi, S. Balovsyak, M. Borcha, I. Hutsuliak, A. Kuzmin, M. Okolita, O. Tkach

Proceedings Volume 12938, 129382F (2024) https://doi.org/10.1117/12.3015863

KEYWORDS: Crystals, Deformation, Diamond, Diffraction, Analytical research, Shape analysis, Digital imaging, Transparency

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Proceedings Article | 5 January 2024 Paper

Paper

Information system for neural network analysis of x-ray Moiré images using wavelet filtering

Ihor Fodchuk, Mariana Borcha, Ivanna Yanchuk

Proceedings Volume 12938, 129382K (2024) https://doi.org/10.1117/12.3016096

KEYWORDS: Artificial neural networks, Wavelets, Crystals, X-rays, X-ray imaging, Tunable filters, Image filtering, Image processing, Mathematical modeling, Moire patterns

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Proceedings Article | 21 December 2021 Paper

Paper

X-ray diffraction and scanning electron microscopy of concrete composites of high structural strength and density

O. Sumariuk, I. Fodchuk, Yu. Roman, I. Hutsuliak, V. Romankevich

Proceedings Volume 12126, 121261L (2021) https://doi.org/10.1117/12.2615859

KEYWORDS: Composites, Cements, X-ray diffraction, Scanning electron microscopy, Silicates, Crystals, X-ray microscopy

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Proceedings Article | 21 December 2021 Paper

Paper

X-ray investigations of structure of thick YIG epitaxial systems of different growth parameters

I. Fodchuk, I. Hutsuliak, V. Dovganyuk, A. Kuzmin, Yu. Roman, M. Solodkyi, P. Pynuk, P. Lytvyn, O. Gudymenko, I. Syvorotka, M. Barchuk

Proceedings Volume 12126, 121261J (2021) https://doi.org/10.1117/12.2615833

KEYWORDS: Magnetism, Garnet, Crystals, Monte Carlo methods, X-rays

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Proceedings Article | 21 December 2021 Paper

Paper

Influence of defect structure on characteristics of X- and γ-radiation detectors based on CdTe:Cl according to high-resolution X-ray diffractometry

I. Fodchuk, A. Kuzmin, O. Maslyanchuk, I. Hutsuliak, M. Solodkyi, Yu. Roman, I. Boledzyuk, P. Pynuk, M. Solovan, O. Gudymenko

Proceedings Volume 12126, 121261K (2021) https://doi.org/10.1117/12.2615854

KEYWORDS: Heterojunctions, Crystals, Sensors, X-rays, X-ray diffraction, X-ray detectors, Spectroscopy

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Proceedings Article | 21 December 2021 Paper

Paper

Crystal defects and charge collection in CdTe-based x- and gamma-ray detectors

O. Maslyanchuk, I. Fodchuk, M. Solovan, I. Boledzyuk, A. Kuzmin, V. Gnatyuk, T. Aoki

Proceedings Volume 12126, 121260K (2021) https://doi.org/10.1117/12.2615504

KEYWORDS: Sensors, Crystals, Diodes, Americium, Photons, Radioisotopes, Gold, Diffusion, Energy efficiency, X-rays

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Proceedings Article | 21 December 2021 Paper

Paper

Fourier energy analysis of Kikuchi patterns for investigation of defect system of diamond crystals

I. Fodchuk, S. Ivakhnenko, V. Tkach, S. Balovsyak, M. Solodkyi, M. Borcha, I. Hutsuliak, A. Kuzmin, Yu. Roman, Y. Smusenko, P. Pynuk

Proceedings Volume 12126, 121261M (2021) https://doi.org/10.1117/12.2615864

KEYWORDS: Crystals, Diamond, Crystallography, Diffraction, Fourier transforms, Spatial frequencies, Digital image processing

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Proceedings Article | 21 December 2021 Paper

Paper

Peculiarities of formation of X-ray moiré images on deformation fields created by set of concentrated forces

I. Fodchuk, Y. Roman, S. Balovsyak, S. Romanyuk, I. Yanchuk, A. Kuzmin, M. Solodkyi, P. Lytvyn

Proceedings Volume 12126, 121262I (2021) https://doi.org/10.1117/12.2617083

KEYWORDS: Fractal analysis, Diffraction, X-rays, X-ray imaging, Interferometers, Crystals, Fourier transforms

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Proceedings Article | 20 August 2020 Poster + Paper

Poster + Paper

The effect of laser treatment on the morphology of graphene/CdTe x-ray and γ-ray detectors

Olena Maslyanchuk, Viktor Strebezhev, Petro Fochuk, Ihor Fodchuk, Mykola Sorokatyi, Aleksey Bolotnikov, R. James

Proceedings Volume 11494, 1149418 (2020) https://doi.org/10.1117/12.2570634

KEYWORDS: Crystals, Graphene, Sensors, Multilayers, X-ray detectors, Resistance

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Proceedings Article | 6 February 2020 Paper

Paper

Determination of structural heterogeneity of crystals from electron backscatter diffraction images with use of the Fourier energy spectrum

Mariana Borcha, Ihor Fodchuk, Mykola Solodkyi, Serhiy Balovsyak, Yurii Roman, Ivan Hutsuliak

Proceedings Volume 11369, 113691I (2020) https://doi.org/10.1117/12.2553974

KEYWORDS: Crystals, Diffraction, Fourier transforms, Diamond, Spatial frequencies, Scanning electron microscopy

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Proceedings Article | 6 February 2020 Paper

Paper

Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry

I. Fodchuk, A. Kuzmin, I. Hutsuliak, M. Solodkyi, V. Dovganyuk, O. Maslyanchuk, Yu. Roman, R. Zaplitnyy, O. Gudymenko, V. Kladko, V. Mоlоdkin, V. Lizunov

Proceedings Volume 11369, 113691H (2020) https://doi.org/10.1117/12.2553970

KEYWORDS: Crystals, Monte Carlo methods, X-rays, Cadmium, X-ray diffraction

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Proceedings Article | 6 February 2020 Paper

Paper

Defect and magnetic structure of Y2.93La0.07Fe5O12/Gd3Ga5O12 epitaxial systems

Ihor Fodchuk, Ivan Hutsuliak, Volodymyr Dovganyuk, Oleksandr Sumariuk, Oleksandr Gudymenko, Vasyl Kladko, Ivan Syvorotka, Andrii Kotsyubynskiy, Michael Barchuk

Proceedings Volume 11369, 113691G (2020) https://doi.org/10.1117/12.2553969

KEYWORDS: Thin films, Crystals, Garnet, Magnetism, Monte Carlo methods, X-ray diffraction

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Proceedings Article | 6 February 2020 Paper

Paper

Charge transport mechanisms and efficiency spectra of thin-film CdS/CdMgTe heterostructures with different mercury content

Olena Maslyanchuk, Ihor Fodchuk, Taras Mykytyuk

Proceedings Volume 11369, 1136917 (2020) https://doi.org/10.1117/12.2553919

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Proceedings Article | 6 November 2019 Paper

Paper

Adaptive oriented filtration of digital images in the spatial domain

Serhiy Balovsyak, Oleksandr Derevyanchuk, Igor Fodchuk, Olga Kroitor, Khrystyna Odaiska, Olexiy Pshenychnyi, Andrzej Kotyra, Akmaral Abisheva

Proceedings Volume 11176, 111761A (2019) https://doi.org/10.1117/12.2537165

KEYWORDS: Image filtering, Digital filtering, Gaussian filters, Visualization, Convolution, Image quality, Image segmentation, Image enhancement, MATLAB, Nonlinear filtering

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Proceedings Article | 23 November 2011 Paper

Paper

The features of x-ray topographic contrast formation in silicon with dislocation clusters

Igor Fodchuk, Sergiy Novikov, Andriy Struk

Proceedings Volume 8338, 83381B (2011) https://doi.org/10.1117/12.920984

KEYWORDS: Diffraction, Scattering, X-rays, Crystals, Kinematics, Silicon, X-ray imaging, Waveguides, Numerical analysis, Light scattering

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Proceedings Article | 23 November 2011 Paper

Paper

High-dose implantation of Y2,95La0,05Fe5O12 epitaxial films by nitrogen ions

N. Pashniak, I. Fodchuk, A. Davydok, A. Biermanns, U. Pietsch, S. Balovsyak, R. Zaplitniy, I. Gutsuliak, O. Bonchyk, G. Savitskiy, I. Vivorotka, V. Stefanyk, I. Yaremiy

Proceedings Volume 8338, 83381C (2011) https://doi.org/10.1117/12.921008

KEYWORDS: Ions, Nitrogen, Ion implantation, Crystals, Chemical species, X-ray diffraction, Iron, Oxygen, Lanthanum, Garnet

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Proceedings Article | 23 November 2011 Paper

Paper

X-ray moiré patterns of silicon crystals with distortions caused by local concentrated forces

Igor Fodchuk, Igor Fesiv, Sergiy Novikov, Yaroslav Struk

Proceedings Volume 8338, 833819 (2011) https://doi.org/10.1117/12.921007

KEYWORDS: Crystals, X-rays, Silicon, Diffraction, Moire patterns, Interferometers, Reflection, X-ray diffraction, Visualization, X-ray imaging

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Proceedings Article | 23 November 2011 Paper

Paper

Use of electron diffraction for determination of strain distribution in synthetic diamonds

S. Balovsyak, M. Borcha, Ya. Garabazhiv, I. Fodchuk, V. Tkach

Proceedings Volume 8338, 83381D (2011) https://doi.org/10.1117/12.921051

KEYWORDS: Crystals, Diamond, Diffraction, Software development, Backscatter, Scanning electron microscopy, Electron microscopes, Charge-coupled devices, Sensors, Anisotropy

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Proceedings Article | 22 April 2008 Paper

Paper

X-ray images of dislocation loops and barriers in silicon crystals in the case of transmission geometry

D. Fedortsov, I. Fodchuk, S. Novikov, A. Struk

Proceedings Volume 7008, 70081A (2008) https://doi.org/10.1117/12.797223

KEYWORDS: Diffraction, Crystals, X-rays, X-ray imaging, Silicon, Numerical analysis, Reflection, X-ray diffraction, Fluctuations and noise, Strontium

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Proceedings Article | 22 April 2008 Paper

Paper

Structural changes in graded band-gap epitaxial layers HgCdTe after ion implantation

R. Zaplitnyy, I. Fodchuk, T. Kazemirskiy, A. Vlasov, O. Yu. Bonchyk, A. Barcz, P. Zieba, Z. Swiatek, W. Maziarz

Proceedings Volume 7008, 70081C (2008) https://doi.org/10.1117/12.797225

KEYWORDS: Mercury cadmium telluride, Ions, Crystals, Annealing, Chemical species, Arsenic, X-rays, Ion implantation, Diffusion, Solids

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Proceedings Article | 22 April 2008 Paper

Paper

Coincidental multiple x-ray diffraction as tool for precise investigation of crystals

M. Borcha, I. Fodchuk, O. Kroitor, Ya. Garabazhiv, O. Kshevetsky

Proceedings Volume 7008, 700819 (2008) https://doi.org/10.1117/12.797221

KEYWORDS: Diffraction, Crystals, X-ray diffraction, Superposition, X-rays, Optical spheres, Laser crystals, Single crystal X-ray diffraction, Distance measurement, Error analysis

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Proceedings Article | 22 April 2008 Paper

Paper

Defect structure changes in the single Si-crystals after irradiation by high-energy electrons and long natural aging by high-resolution three-crystal x-ray diffractometry

V. Dovganyuk, T. Lytvynchuk, V. Slobodyan, M. Fodchuk

Proceedings Volume 7008, 70081B (2008) https://doi.org/10.1117/12.797224

KEYWORDS: Crystals, Reflection, Diffraction, Diffusion, Scattering, X-ray diffraction, Silicon, X-rays, Spherical lenses, Electrons

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Proceedings Article | 4 June 2004 Paper

Paper

X-ray analysis of strain relaxation in multilayer systems InxGa1-xAS1-yNy/GaAs

Markus Pessa, Emil-Mihai Pavelescu, Igor Fodchuk, V. Gevyk, A. Shpak, V. Molodkin, E. Kislovskii, S. Olikhovskii

Proceedings Volume 5477, (2004) https://doi.org/10.1117/12.560019

KEYWORDS: Quantum wells, Gallium arsenide, Chemical species, X-rays, Annealing, Gallium, X-ray diffraction, Nitrogen, Indium, Multilayers

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Proceedings Article | 4 June 2004 Paper

Paper

New principles of diagnostics of surface parameters of solids by methods of x-ray total external reflection

S. Balovsyak, Igor Fodchuk

Proceedings Volume 5477, (2004) https://doi.org/10.1117/12.559861

KEYWORDS: X-rays, Atomic force microscopy, Reflection, Fractal analysis, Gallium arsenide, Radium, Analytical research, Thulium, Diagnostics, Solids

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Proceedings Article | 18 November 1999 Paper

Paper

Pendellosung fringes in distorted crystals

M. Raransky, Igor Fodchuk, Ya. Struk, S. Bobrovnik

Proceedings Volume 3904, (1999) https://doi.org/10.1117/12.370436

KEYWORDS: Crystals, Scattering, Diffraction, Numerical analysis, X-rays, Chromium, Silicon, Laser scattering, Phase shift keying, Refraction

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Proceedings Article | 18 November 1999 Paper

Paper

Formation features of microdefect x-ray topography images in silicon crystals

Igor Fodchuk, M. Raransky, S. Novikov, P. Marmus, S. Bobrovnik

Proceedings Volume 3904, (1999) https://doi.org/10.1117/12.370439

KEYWORDS: Crystals, Diffraction, Scattering, Ultrasonics, X-rays, Silicon, X-ray imaging, Diffusion, Acoustics, Numerical analysis

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Proceedings Article | 18 November 1999 Paper

Paper

Unusual multiple x-ray transmissions in crystals with one-dimensional strains

Igor Fodchuk, M. Raransky, M. Borcha, L. Gultaj, I. Krytsun

Proceedings Volume 3904, (1999) https://doi.org/10.1117/12.370437

KEYWORDS: Diffraction, Scattering, Crystals, X-rays, Acoustics, Reflection, Lithium, Chemical species, Germanium, Chromium

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Proceedings Article | 18 November 1999 Paper

Paper

Structural changes in silicon implanted by phosphorus

Igor Fodchuk, M. Raransky, O. Gimchinsky, V. Godovaniouk, L. Gultaj, Z. Swiatek, J. Bonarsky

Proceedings Volume 3904, (1999) https://doi.org/10.1117/12.370438

KEYWORDS: Crystals, Silicon, Diffraction, Ions, Annealing, Reflection, Phosphorus, X-rays, Chemical species, Distortion

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Proceedings Article | 8 April 1999 Paper

Paper

Peculiarities of MCT ion etching in rf mercury glow discharge

Volodymyr Savitsky, Leonid Mansurov, Igor Fodchuk, Igor Izhnin, Igor Virt, Mariya Lozynska, Andrij Evdokimenko

Proceedings Volume 3725, (1999) https://doi.org/10.1117/12.344754

KEYWORDS: Etching, Mercury, Ions, Argon, Crystals, Reflection, X-rays, Cadmium, Diffusion, Diffraction

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Proceedings Article | 10 November 1995 Paper

Paper

Applied possibilities for x-ray diffraction interferometry

M. Raransky, J. Struk, Igor Fodchuk, V. Shafraniuk, A. Raransky

Proceedings Volume 2647, (1995) https://doi.org/10.1117/12.226734

KEYWORDS: Moire patterns, Crystals, Interferometers, X-ray diffraction, Diffraction, Interferometry, X-rays, Silicon, Single crystal X-ray diffraction, Laser crystals

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Proceedings Article | 10 November 1995 Paper

Paper

X-ray diffraction optics of the submicron surface layers

Igor Fodchuk, A. Raransky, Andrij Evdokimenko

Proceedings Volume 2647, (1995) https://doi.org/10.1117/12.226722

KEYWORDS: Crystals, Diffraction, Reflection, X-ray diffraction, Single crystal X-ray diffraction, Ions, Electrons, X-rays, Laser crystals, X-ray optics

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Proceedings Article | 10 December 1993 Paper

Paper

Solution of x-ray diffraction inverse problems in optics

A. Raransky, J. Struk, Igor Fodchuk, M. Raransky

Proceedings Volume 2108, (1993) https://doi.org/10.1117/12.165401

KEYWORDS: Crystals, Diffraction, X-ray diffraction, Laser crystals, X-rays, Moire patterns, X-ray optics, Reflection, Inverse optics, Interferometers

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Showing 5 of 34 publications

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