Dr. Jian Chen Profile

Dr. Jian Chen

at ZC Optoelectronic Technologies Ltd

SPIE Involvement:

Author

Publications (25)

Proceedings Article | 23 December 2023 Paper

Progress on defect inspection for large-aperture optics

Jian Chen, Jianda Shao, Ming Huang, Shijie Liu, Zhouling Wu

Proceedings Volume 12982, 129820W (2023) https://doi.org/10.1117/12.3021253

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Proceedings Article | 9 October 2021 Paper

A multimodal method for defect characterization of large-aperture optics

Jian Chen, Weiyang Yu, Haifeng Zhou, Jian Zhang, Xi Wang, Wenyang Xu, Ming Huang

Proceedings Volume 11899, 118990D (2021) https://doi.org/10.1117/12.2603703

KEYWORDS: Laser scattering, Confocal microscopy, Scattering, Optics manufacturing, Microscopy, Laser induced damage, Defect inspection, Inspection, Absorption

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Proceedings Article | 21 June 2019 Paper

Wavelength-switchable Fizeau interferometry and its applications

Shijie Liu, Qi Lu, You Zhou, Xueke Xu, Jianda Shao, Zhouling Wu, Jian Chen, Ming Huang

Proceedings Volume 11056, 1105627 (2019) https://doi.org/10.1117/12.2526377

KEYWORDS: Wavefronts, Interferometry, Interferometers, Aspheric lenses, Optical filters, Error analysis, Photovoltaics, Glasses, Optical components, Collimation

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Proceedings Article | 29 March 2019 Paper

Mid-infrared optical parametric oscillator pumped by dual-wavelength fiber laser based on SRS effect

Jiacheng Feng, Peng Wang, Xi Cheng, Xiao Li, Weihong Hua, Kai Han, Jian Chen

Proceedings Volume 11046, 1104611 (2019) https://doi.org/10.1117/12.2524442

KEYWORDS: Optical parametric oscillators, Mid-IR, Fiber lasers, Crystals, Laser crystals, Nonlinear crystals

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Proceedings Article | 1 August 2017 Paper

Development of an infrared absorption measurement system for large aperture optics

Jian Chen, Jingtao Dong, Bingbing Li, Zhouling Wu

Proceedings Volume 10339, 103391A (2017) https://doi.org/10.1117/12.2275972

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Proceedings Article | 4 May 2015 Paper

Photothermal microscopy: an effective diagnostic tool for laser irradiation effects on fused silica and KDP

Zhouling Wu, Jian Chen, Jingtao Dong

Proceedings Volume 9543, 95431V (2015) https://doi.org/10.1117/12.2182235

KEYWORDS: Absorption, Silica, Laser induced damage, Laser irradiation, Laser beam diagnostics, Laser processing, Microscopy, High power lasers, Photothermal effect, Diagnostics

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Proceedings Article | 4 May 2015 Paper

Evaluation of surface and bulk qualities of semiconductor materials by a laser-induced photothermal technique

Jingtao Dong, Jian Chen, Shiwen Sun, Dawei Zhang, Songlin Zhuang, Zhouling Wu

Proceedings Volume 9543, 95431B (2015) https://doi.org/10.1117/12.2182237

KEYWORDS: Crystals, Semiconductor materials, Absorption, Semiconducting wafers, Microscopy, Semiconductor lasers, Polishing, Refractive index, Silicon, Laser beam diagnostics

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Proceedings Article | 26 February 2015 Paper

In-situ investigation of damage processes on fused silica induced by a pulsed 355nm laser with high repetition rate

Jian Chen, Jingtao Dong, Zhouling Wu

Proceedings Volume 9345, 93450A (2015) https://doi.org/10.1117/12.2079085

KEYWORDS: Silica, Absorption, Laser induced damage, Laser processing, Laser irradiation, Pulsed laser operation, Laser beam diagnostics, Laser damage threshold, Laser scattering, Thermal effects

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Proceedings Article | 20 February 2015 Paper

Photothermal studies of the radiation effects on weakly absorptive optical thin film coatings induced by high repetitive laser pulses

Jingtao Dong, Jian Chen, Zhouling Wu, Huasong Liu, Yiqin Ji

Proceedings Volume 9346, 93460X (2015) https://doi.org/10.1117/12.2079099

KEYWORDS: Absorption, Thin film coatings, Laser beam diagnostics, Laser irradiation, Optical coatings, Continuous wave operation, Radiation effects, Laser processing, High power lasers, Modulation

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Proceedings Article | 31 October 2014 Paper

Photothermal microscopic studies of surface and subsurface defects on fused silica at 355nm

Jian Chen, Jingtao Dong, Qi Zhang, Zhouling Wu

Proceedings Volume 9237, 923706 (2014) https://doi.org/10.1117/12.2068119

KEYWORDS: Silica, Absorption, Laser induced damage, Microscopy, Laser beam diagnostics, Polishing, Microscopes, Surface finishing, 3D image processing, High power lasers

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Proceedings Article | 31 October 2014 Paper

Development of an automated absorption measurement instrument (a “turn-key” system) for optical thin film coatings

Jingtao Dong, Jian Chen, Zhouling Wu

Proceedings Volume 9237, 92371W (2014) https://doi.org/10.1117/12.2068121

KEYWORDS: Absorption, Thin film coatings, Absorbance, Laser beam diagnostics, Coating, Thermal effects, Laser applications, Sensors, Temperature metrology, Reflectivity

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Proceedings Article | 31 October 2014 Paper

Three dimensional mapping of absorption defects at 355 nm for potassium dihydrogen phosphate (KDP) used in high power laser systems

Jian Chen, Jingtao Dong, Qi Zhang, Zhouling Wu

Proceedings Volume 9237, 923716 (2014) https://doi.org/10.1117/12.2068120

KEYWORDS: Absorption, Crystals, Microscopes, High power lasers, 3D image processing, Laser beam diagnostics, Laser systems engineering, Microscopy, Potassium, Laser induced damage

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Proceedings Article | 5 September 2014 Paper

A sensitive optical probe for surface topography based on an optimized astigmatic method

Jingtao Dong, Gang Xiao, Jian Chen, Zhouling Wu

Proceedings Volume 9205, 920507 (2014) https://doi.org/10.1117/12.2062524

KEYWORDS: Reflectivity, Objectives, Head, Signal detection, Mirrors, Calibration, Microscopes, Glasses, Digital video discs, Ferroelectric materials

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Proceedings Article | 18 August 2014 Paper

Three-dimensional photothermal microscopy of KDP crystals

Jian Chen, Jingtao Dong, Qi Zhang, Zhouling Wu

Proceedings Volume 9203, 92030W (2014) https://doi.org/10.1117/12.2062528

KEYWORDS: Absorption, Crystals, Microscopes, Laser crystals, Laser beam diagnostics, Laser induced damage, High power lasers, 3D image processing, Microscopy, Laser damage threshold

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Proceedings Article | 9 July 2013 Paper

Study of photothermal response in thin film coatings by ellipsometry

Jingtao Dong, Jian Chen, Zhouling Wu

Proceedings Volume 8786, 87861A (2013) https://doi.org/10.1117/12.2020445

KEYWORDS: Laser beam diagnostics, Polarization, Refractive index, Absorption, Ellipsometry, Modulation, Thin film coatings, Statistical analysis, Polarizers, Beam splitters

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Proceedings Article | 9 July 2013 Paper

Development of a "turn-key" system for weak absorption measurement and analysis

Jian Chen, Jingtao Dong, Zhouling Wu

Proceedings Volume 8786, 87861M (2013) https://doi.org/10.1117/12.2020455

KEYWORDS: Absorption, Laser beam diagnostics, High power lasers, Refractive index, Modulation, Laser irradiation, Thin film coatings, Photothermal effect, 3D image processing, Optical components

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Proceedings Article | 9 July 2013 Paper

Laser cutting of ultra-thin glasses based on a nonlinear laser interaction effect

Jian Chen, Zhouling Wu

Proceedings Volume 8786, 87860E (2013) https://doi.org/10.1117/12.2020467

KEYWORDS: Laser cutting, Glasses, Absorption, Pulsed laser operation, Laser processing, Laser glasses, Picosecond phenomena, Laser ablation, Electrons, Plasma

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Proceedings Article | 9 July 2013 Paper

Design and development of an automated laser processing system for photovoltaic applications

Jian Chen, Zhouling Wu

Proceedings Volume 8786, 87860A (2013) https://doi.org/10.1117/12.2020442

KEYWORDS: Laser processing, Solar cells, Laser drilling, Doping, Laser ablation, Manufacturing, Silicon, Metals, Silicon solar cells, Photovoltaics

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Proceedings Article | 12 January 2012 Paper

Progress in advanced laser processing for manufacturing of high efficiency silicon solar cells

Jian Chen, Li Chen, Zhouling Wu, Junhong Yang, Yunfeng Ma

Proceedings Volume 8206, 82061E (2012) https://doi.org/10.1117/12.910470

KEYWORDS: Manufacturing, Silicon, Doping, Laser processing, Laser ablation, Silicon solar cells, Solar cells, Metals, Semiconductor lasers, Dielectrics

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Proceedings Article | 5 November 2010 Paper

2D THz and GHz signature for identification of explosive on reflected THz signal

Vyacheslav Trofimov, Svetlana Varentsova, Jian Chen

Proceedings Volume 7854, 785409 (2010) https://doi.org/10.1117/12.870320

KEYWORDS: Terahertz radiation, Picosecond phenomena, Absorption, Explosives, Signal analyzers, Signal detection, Statistical analysis, Molecules, Reliability, Receivers

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The method of THz spectrum dynamics analysis (SDA - Spectral dynamics analysis - method) is applied for the detection and identification of substances by using the signal reflected from sample. It allows to obtain the spectrogram - composite Fourier spectrum dynamics - of the signal and to analyze the dynamics of many spectral lines simultaneously, even if the measurements are made on short time interval (less than 50 ps). The efficiency of the SDA method used for longer time intervals (more than 100 ps) is discussed also. The Fourier-Gabor sliding window method is used for obtaining the spectrogram. We consider the examples of finding the pure RDX and harmless materials (L-Tartaric Acid, Sucrose, PTFE) or their mixture in pellets by using a THz pulse reflected from them. A THz pulse with a few cycles falls on the sample and reflects from it. The receiver makes the discrete measurements of electric field strength of signal reflected from the sample. To restore the signal to the required accuracy the SVD - Single Value Decomposition - technique is used. Our investigations show that the spectrograms and dynamics of several spectral lines of the THz pulse reflected differ from the corresponding spectrograms and dynamics of spectral lines for the reference pulse under certain conditions and hence it is possible to detect the presence of the material in the sample of interest. The comparison of the Fourier spectrum of the substance with the corresponding spectrum calculated on the base of using an autocorrelation function for obtaining the spectrum shows that the AC-spectrum gives us essential less information about substance. From our consideration follows that in some cases the analysis of reflected signal on the short time interval (less than 50 ps) is insufficient for the reliable identification. It is necessary to analyze the response on the long time interval (about 300 - 400 ps). The analysis of spectrogram and spectral lines dynamics on the long time intervals gives the additional information about registering sub-pulses, which are appeared due to multi-reflection of THz wave from the boundaries of sample and from the reflecting elements of set-up, and relaxation times of excited energy levels of molecules. Hence, the reliability of identification increases.

Proceedings Article | 12 October 2010 Paper

Identification of explosive using the spectrum dynamics of reflected THz and GHz radiation

Vyacheslav Trofimov, Svetlana Varentsova, Jian Chen

Proceedings Volume 7837, 78370G (2010) https://doi.org/10.1117/12.864873

KEYWORDS: Terahertz radiation, Picosecond phenomena, Absorption, Explosives, Statistical analysis, Signal analyzers, Molecules, Signal detection, Receivers, Reliability

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Proceedings Article | 4 May 2010 Paper

Measurement and modeling of terahertz spectral signatures from layered material

G. Kniffin, S, Schecklman, J. Chen, S. Henry, L. Zurk, B. Pejcinovic, A. Timchenko

Proceedings Volume 7687, 768708 (2010) https://doi.org/10.1117/12.855075

KEYWORDS: Terahertz radiation, Reflection, Absorption, Data modeling, Statistical modeling, Error analysis, Reflectivity, Explosives, Statistical analysis, Inverse problems

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Proceedings Article | 27 April 2010 Paper

Method of THz spectrum dynamics analysis for identification of compound medium

Vyacheslav Trofimov, Svetlana Varentsova, Jian Chen

Proceedings Volume 7671, 76710G (2010) https://doi.org/10.1117/12.849983

KEYWORDS: Terahertz radiation, Absorption, Explosives, Signal detection, Transparency, Picosecond phenomena, Reconstruction algorithms, Explosives detection, Defense and security, Visible radiation

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Proceedings Article | 25 September 2009 Paper

Identification of explosive media using spectrum dynamics under the action of a THz pulse

Vyacheslav Trofimov, Svetlana Varentsova, Jian Chen, Xi-Cheng Zhang

Proceedings Volume 7486, 74860A (2009) https://doi.org/10.1117/12.830162

KEYWORDS: Terahertz radiation, Absorption, Explosives, Transparency, Picosecond phenomena, Molecules, Analytical research, Signal detection, Receivers, Pulsed laser operation

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Proceedings Article | 4 January 2008 Paper

Terahertz spectroscopy in pulsed laser deposited LaCa0.7Mn0.3O3/MgO thin films

F. Gao, J. Chen, S. Dou, X. C. Zhang

Proceedings Volume 6840, 68401I (2008) https://doi.org/10.1117/12.757959

KEYWORDS: Terahertz radiation, Thin films, Cardiovascular magnetic resonance imaging, Temperature metrology, Absorbance, Indium arsenide, Terahertz spectroscopy, Thin film deposition, Spectroscopy, Optical properties

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Showing 5 of 25 publications

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