Prof. Long Chen Profile

Prof. Long Chen

at Chongqing Institute of Metrology and Quality Inspection

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Author

Publications (7)

Proceedings Article | 4 December 2024 Paper

Characterization of wafer surface morphology based on atomic force microscopy

Yueqing Ding, Chong Yue, Lei Tao, Long Chen, Jin Zhou

Proceedings Volume 13283, 132832I (2024) https://doi.org/10.1117/12.3036788

KEYWORDS: Semiconducting wafers, Atomic force microscopy, Surface roughness, Interferometers, Semiconductors, Microelectronics, Optical surfaces, Atomic force microscope, Time metrology

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Proceedings Article | 9 March 2023 Paper

Research and application of gauge block intelligent measurement system based on inductance micrometer

Jin Zhou, Tingting Ren, Lei Tao, Tao Zhang, Long Chen

Proceedings Volume 12600, 126000W (2023) https://doi.org/10.1117/12.2674002

KEYWORDS: Intelligence systems, Sensors, Calibration, Inductance, Error control coding, Metrology

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Proceedings Article | 10 February 2023 Paper

Studies on construction of real time kinematic inspection field based on geographic information and remote sensing technology

Tong Liu, Tingting Ren, Tao Zhang, Lei Tao, Long Chen

Proceedings Volume 12552, 125521C (2023) https://doi.org/10.1117/12.2667359

KEYWORDS: Navigation systems, Calibration, Satellite navigation systems, Receivers, Satellites, Antennas, Kinematics, Software development

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Proceedings Article | 23 May 2022 Paper

Studies on calibration of on-board intelligent service terminal of cruising taxi

Tingting Ren, Lei Tao, Tong Liu, Long Chen, Yong Huang, Shiqiang Zhou

Proceedings Volume 12254, 1225413 (2022) https://doi.org/10.1117/12.2638604

KEYWORDS: Calibration, Velocity measurements, Metrology, Clocks, Uncertainty analysis, Distance measurement, Time metrology, Measurement devices

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Proceedings Article | 10 October 2020 Poster + Presentation + Paper

An improved device for the 3D optical scanner calibration and related influence factors on calibrating result

Yi-Kun Xiong, Jian Xu, Sen Zhou, Long Chen, Jun Xiong

Proceedings Volume 11552, 1155213 (2020) https://doi.org/10.1117/12.2573168

KEYWORDS: Calibration, 3D scanning, Optical scanning, Optical calibration, 3D metrology, Optical spheres, Optics manufacturing, Inspection, 3D imaging standards, Clouds

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Proceedings Article | 6 May 2019 Paper

Development of a calibration device for the optical scanner

Long Chen, Yi-Kun Xiong, Sen Zhou, Ying-Qian Ni, Jun Xiong

Proceedings Volume 11069, 110692Z (2019) https://doi.org/10.1117/12.2524385

KEYWORDS: Optical scanning, Calibration, Spherical lenses, Optical calibration, Optical testing, Distance measurement, Metrology, Scanners, Error analysis

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Proceedings Article | 24 November 2016 Paper

Truncated pyramid artifact for performance evaluation experiments on laser line scanner

Sen Zhou, Jian Xu, Tao Lei, Chen Long, Tang Jing

Proceedings Volume 10023, 1002329 (2016) https://doi.org/10.1117/12.2248455

KEYWORDS: Laser scanners, 3D scanning, Metrology, Calibration, 3D metrology, Manufacturing, Scanners, Inspection, Sensors, Laser applications

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Showing 5 of 7 publications

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