Morris I. Kaufman
Principal Engineer at National Security Technologies LLC
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Author
Publications (40)

Proceedings Article | 30 September 2024 Presentation + Paper
Robert Malone, James Blackwell, Jesus Castanada, Todd Haines, Kevin Joyce, Morris Kaufman, Derek Lotarski, Kevin McGillivray, Anthony Mendez, Lakhena Raingsan, Martin Palagi, Katherine Walters, Eloisa Zepeda-Alarcon
Proceedings Volume 13133, 1313307 (2024) https://doi.org/10.1117/12.3028692
KEYWORDS: Scintillators, X-rays, Zoom lenses, Cameras, Imaging systems, Calibration, Radiography, Pellicles, Optical alignment, X-ray sources

SPIE Journal Paper | 4 April 2024
OE, Vol. 63, Issue 04, 045101, (April 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.4.045101
KEYWORDS: Adhesives, Glasses, Failure analysis, Finite element methods, Interfaces, Lenses, Optical engineering, Ultraviolet radiation, Industry, Glues

Proceedings Article | 2 October 2023 Presentation + Paper
Proceedings Volume 12666, 126660A (2023) https://doi.org/10.1117/12.2681320
KEYWORDS: Scintillators, Cameras, Imaging systems, CCD cameras, Zoom lenses, X-rays, Radiography, Distortion, Modulation transfer functions, Design and modelling

Proceedings Article | 3 October 2022 Presentation + Paper
Proceedings Volume 12222, 122220F (2022) https://doi.org/10.1117/12.2632109
KEYWORDS: Tolerancing, Code v, Glasses, Manufacturing, Statistical analysis, Modulation transfer functions, Francium, Error analysis, Optics manufacturing, Data centers

Proceedings Article | 28 October 2021 Presentation + Paper
Proceedings Volume 11889, 118890W (2021) https://doi.org/10.1117/12.2601823
KEYWORDS: Glasses, Adhesives, Interfaces, Failure analysis, Lens design, Ultraviolet radiation, Finite element methods, Electronics, Temperature metrology, Epoxies

Showing 5 of 40 publications
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