Rongbo Zhao
at Institute of Microelectronics of the CAS
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 March 2020 Paper
Proceedings Volume 11323, 113232E (2020) https://doi.org/10.1117/12.2552008
KEYWORDS: Photomasks, Extreme ultraviolet lithography, Source mask optimization, Nanoimprint lithography, Lithography, Extreme ultraviolet, Electroluminescence, Reflectivity, Critical dimension metrology, Light scattering

Proceedings Article | 26 September 2019 Paper
Proceedings Volume 11147, 111471V (2019) https://doi.org/10.1117/12.2536871
KEYWORDS: Photomasks, Extreme ultraviolet lithography, Lithography, Lithographic illumination, Fiber optic illuminators, Numerical simulations, Deep ultraviolet, Absorption, Reflectivity, Surface roughness

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