Unspecified Thomas R. Fanning Profile

Thomas R. Fanning

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Publications (9)

Proceedings Article | 24 February 2020 Paper

Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation

Thomas Fanning, John Maynard, Christopher Helms, Lei Yang, David Podva, Jeff Earls, Jacob Lopez, Michael Chung, James Foresi, Mial Warren, Gianluca Bacchin

Proceedings Volume 11300, 1130002 (2020) https://doi.org/10.1117/12.2546689

KEYWORDS: 3D-TOF imaging, Vertical cavity surface emitting lasers, Epitaxy, Semiconducting wafers, Manufacturing, Reliability, Standards development, LIDAR, Humidity, Particles

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Proceedings Article | 25 February 2017 Paper

50Gb/s PAM-4 oxide VCSEL development progress at Broadcom

Jingyi Wang, M. V. Ramana Murty, Charlie Wang, David Hui, Ann Lehman Harren, Hsu-Hao Chang, Zheng-Wen Feng, Thomas Fanning, Aaditya Sridhara, Sumitro-Joyo Taslim, Xinle Cai, Jason Chu, Laura Giovane

Proceedings Volume 10122, 1012202 (2017) https://doi.org/10.1117/12.2250211

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Modulation, Optoelectronics, Optical interconnects, Transceivers, Eye, Reliability, Data communications, Manufacturing, Temperature metrology, Quantum wells, Forward error correction

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Proceedings Article | 4 March 2015 Paper

Mode partition noise characterization of 25 Gb/s VCSELs

M. V. Ramana Murty, David Cunningham, Laura Giovane, Jingyi Wang, Zheng-Wen Feng, Thomas Fanning

Proceedings Volume 9381, 938104 (2015) https://doi.org/10.1117/12.2084269

KEYWORDS: Vertical cavity surface emitting lasers, Signal to noise ratio, Eye, Modulation, Interference (communication), Dispersion, Filtering (signal processing), Transmittance, Receivers, Fabry–Perot interferometers

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Proceedings Article | 27 February 2014 Paper

28-Gbps 850-nm oxide VCSEL development and manufacturing progress at Avago

Thomas Fanning, Jingyi Wang, Zheng-Wen Feng, Mark Keever, Chen Chu, Aaditya Sridhara, Cesare Rigo, Hairong Yaun, Terry Sale, Gim-Hong Koh, Ramana Murty, Samir Aboulhouda, Laura Giovane

Proceedings Volume 9001, 900102 (2014) https://doi.org/10.1117/12.2039499

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Oxides, Indium gallium arsenide, Quantum wells, Semiconducting wafers, Modulation, Temperature metrology, Manufacturing, Optics manufacturing

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Proceedings Article | 13 March 2013 Paper

28 Gb/s 850 nm oxide VCSEL development at Avago

Jingyi Wang, Mark Keever, Zheng-Wen Feng, Thomas Fanning, Chen Chu, Aadi Sridhara, Friedhelm Hopfer, Terry Sale, An-Nien Cheng, Bing Shao, Li Ding, Pengyue Wen, Hsu-Hao Chang, Charlie Wang, David Chak Wang Hui, Laura Giovane

Proceedings Volume 8639, 86390K (2013) https://doi.org/10.1117/12.2004521

KEYWORDS: Vertical cavity surface emitting lasers, Modulation, Oxides, Temperature metrology, Eye, Reliability, Transceivers, Optics manufacturing, Data communications, Resistance

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Proceedings Article | 13 March 2013 Paper

VCSELs for high-speed data networks

M. V. Ramana Murty, L. Giovane, S. Ray, K. -L. Chew, M. Crom, T. Sale, A. Sridhara, C. Zhao, Chu Chen, T. Fanning

Proceedings Volume 8639, 863902 (2013) https://doi.org/10.1117/12.2005392

KEYWORDS: Vertical cavity surface emitting lasers, Diodes, Modulation, Lithium, Laser damage threshold, Quantum wells, Temperature metrology, Measurement devices, Laser development, Reverse modeling

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Proceedings Article | 7 February 2009 Paper

New developments in 850 and 1300nm VCSELs at JDSU

Luke Graham, Melinda Schnoes, Kevin Maranowski, Thomas Fanning, Max Crom, Stewart Feld, Matthew Gray, Karen Bowers, Steve Silva, Kirk Cook, Gayle Schomberger, Ben Gable

Proceedings Volume 7229, 72290B (2009) https://doi.org/10.1117/12.809649

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Reliability, Photomasks, Transceivers, Temperature metrology, Oxides, Failure analysis, Wafer-level optics, Standards development

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Proceedings Article | 12 February 2008 Paper

LW VCSELs for SFP+ applications

Luke Graham, Jack Jewell, Kevin Maranowski, Max Crom, Stewart Feld, Joseph Smith, James Beltran, Thomas Fanning, Melinda Schnoes, Matthew Gray, David Droege, Vera Koleva, Mike Dudek, John Fiers, Russ Patterson

Proceedings Volume 6908, 690802 (2008) https://doi.org/10.1117/12.771288

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Semiconducting wafers, Reliability, Transceivers, Eye, Temperature metrology, Chlorine, Wafer-level optics, Code division multiplexing

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Proceedings Article | 10 February 2006 Paper

1310nm VCSELs in 1-10Gb/s commercial applications

Jack Jewell, Luke Graham, Max Crom, Kevin Maranowski, Joseph Smith, Tom Fanning

Proceedings Volume 6132, 613204 (2006) https://doi.org/10.1117/12.660840

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Transceivers, Laser marking, Semiconducting wafers, Error analysis, Laser applications, Single mode fibers, Temperature metrology, Optical filters

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Showing 5 of 9 publications

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