Mr. Uwe B. Schallenberg Profile

Uwe B. Schallenberg

Head of R&D Dept at Optics Blazers Jena GmbH

SPIE Involvement:

Author

Publications (28)

Proceedings Article | 21 November 2017 Open Access

Technological development of spectral filters for Sentinel-2

Karin Schröter, Uwe Schallenberg, Matthias Mohaupt

Proceedings Volume 10566, 105662M (2017) https://doi.org/10.1117/12.2308206

KEYWORDS: Optical filters, Short wave infrared radiation, Transmittance, Optical fabrication, Coating, Environmental sensing, Manufacturing, Multispectral imaging, Linear filtering, Visible radiation

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Proceedings Article | 4 October 2011 Paper

Manufacturing and characterizing of all-dielectric band-pass filters for the short-wave infrared region

T. Bauer, M. Lappschies, U. Schallenberg, S. Jakobs

Proceedings Volume 8168, 81680Z (2011) https://doi.org/10.1117/12.896869

KEYWORDS: Short wave infrared radiation, Optical filters, Bandpass filters, Optics manufacturing, Linear filtering, Thin films, Sensors, Manufacturing, Coating, Infrared radiation

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Proceedings Article | 4 October 2011 Paper

Exclusive examples of high-performance thin-film optical filters for fluorescence spectroscopy made by plasma-assisted reactive magnetron sputtering

M. Lappschies, U. Schallenberg, S. Jakobs

Proceedings Volume 8168, 81680Y (2011) https://doi.org/10.1117/12.896846

KEYWORDS: Coating, Optical filters, Thin films, Bandpass filters, Transmittance, Linear filtering, Optics manufacturing, Fluorescence spectroscopy, Sputter deposition, Scattering

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Proceedings Article | 4 October 2011 Paper

Nanostructures versus thin films in the design of antireflection coatings

Uwe Schallenberg

Proceedings Volume 8168, 81681N (2011) https://doi.org/10.1117/12.896841

KEYWORDS: Thin films, Nanostructures, Antireflective coatings, Refractive index, Thin film coatings, Autoregressive models, Visible radiation, Near infrared, Reflection, Thin film manufacturing

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Proceedings Article | 22 July 2010 Paper

Design and manufacturing of high-performance notch filters

Uwe Schallenberg, Beatrix Ploss, Marc Lappschies, Stefan Jakobs

Proceedings Volume 7739, 77391X (2010) https://doi.org/10.1117/12.856580

KEYWORDS: Linear filtering, Transmittance, Reflectivity, Telescopes, Beam splitters, Optics manufacturing, Manufacturing, Sputter deposition, Optical filters, Design for manufacturability

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Proceedings Article | 25 September 2008 Paper

Reliable production of steep edge interference filters

Marc Lappschies, Peter Pfeifer, Uwe Schallenberg, Henrik Ehlers, Detlev Ristau

Proceedings Volume 7101, 71010P (2008) https://doi.org/10.1117/12.797459

KEYWORDS: Transmittance, Coating, Linear filtering, Interference filters, Optical filters, Spectroscopy, Refractive index, Sensors, Ions, Deposition processes

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Proceedings Article | 25 September 2008 Paper

Design principles for broadband AR coatings

Uwe Schallenberg

Proceedings Volume 7101, 710103 (2008) https://doi.org/10.1117/12.797708

KEYWORDS: Refractive index, Antireflective coatings, Thin films, Reflectivity, Multilayers, Reflection, Coating, Thin film coatings, Optical design, Optical components

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Proceedings Article | 25 September 2008 Paper

High performance notch filter coatings produced with PIAD and magnetron sputtering

M. Scherer, U. Schallenberg, H. Hagedorn, W. Lehnert, B. Romanov, A. Zoeller

Proceedings Volume 7101, 71010I (2008) https://doi.org/10.1117/12.797699

KEYWORDS: Linear filtering, Transmittance, Sputter deposition, Refractive index, Silica, Manufacturing, Absorbance, Optical coatings, Optical filters, Apodization

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Proceedings Article | 5 October 2005 Paper

Comparison of gradient index and classical designs of a narrow band notch filter

Vesna Janicki, Marc Lappschies, Björn Görtz, Detlev Ristau, Uwe Schallenberg, Olaf Stenzel, Norbert Kaiser

Proceedings Volume 5963, 59631O (2005) https://doi.org/10.1117/12.624640

KEYWORDS: Refractive index, Reflectivity, Linear filtering, Gradient-index optics, Optical coatings, Transmittance, Absorbance, Apodization, Optical filters, Niobium

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Proceedings Article | 5 October 2005 Paper

Steep-edge filter design with equivalent layers

Uwe Schallenberg

Proceedings Volume 5963, 59630A (2005) https://doi.org/10.1117/12.624112

KEYWORDS: Optical filters, Thin films, Refractive index, Multilayers, Antireflective coatings, Interference filters, Absorbance, Manufacturing, Digital filtering, Optical components

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Proceedings Article | 25 February 2004 Paper

High-precision longpass filter arrays for miniature spectrometers

Stefan Jakobs, Uwe Schallenberg

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.516918

KEYWORDS: Optical filters, Atomic force microscopy, Scanning electron microscopy, Photoresist materials, Optical filtering, Optical coatings, Image filtering, Spectrometers, Optical microscopy, Charge-coupled devices

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Proceedings Article | 25 February 2004 Paper

Multicycle AR coatings: a theoretical approach

Uwe Schallenberg, Ulrike Schulz, Norbert Kaiser

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513416

KEYWORDS: Refractive index, Antireflective coatings, Reflectivity, Quantum wells, Optical coatings, Thin films, Autoregressive models, Plastic coatings, Physical vapor deposition, Berkelium

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Proceedings Article | 19 October 2000 Paper

Abrasion-resistant antireflection coating for plastics

Ulrike Schulz, Uwe Schallenberg, Norbert Kaiser

Proceedings Volume 4094, (2000) https://doi.org/10.1117/12.404752

KEYWORDS: Coating, Antireflective coatings, Polymethylmethacrylate, Refractive index, Resistance, Reflectivity, Hard coatings, Polymers, Ions, Multilayers

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Proceedings Article | 19 October 2000 Paper

Spectral-sensitive on-chip masking of Si-PIN-diodes using patterned and self-blocked optical coatings

Uwe Schallenberg, Stefan Jakobs, Wolfgang Buss

Proceedings Volume 4094, (2000) https://doi.org/10.1117/12.404753

KEYWORDS: Optical filters, Optical coatings, Photodiodes, Silicon, Thin films, Interference filters, RGB color model, Reflectivity, Diodes, Sensors

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Proceedings Article | 7 September 1999 Paper

Analytical design of multicycle broadband AR coatings

Uwe Schallenberg, Stefan Jakobs, Norbert Kaiser

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360085

KEYWORDS: Antireflective coatings, Refractive index, Autoregressive models, Reflectivity, Interfaces, Thin films, Thin film coatings, Multilayers, Glasses, Mathematical modeling

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Proceedings Article | 7 September 1999 Paper

Design and fabrication of miniaturized dielectric interference coatings

Marcus Frank, Norbert Kaiser, Uwe Schallenberg

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360121

KEYWORDS: Photomasks, Interference filters, Digital filtering, Optical filters, Etching, Manufacturing, Reactive ion etching, Deposition processes, Dielectrics, Diodes

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SPIE Journal Paper | 1 September 1998

Multispectral dielectric micro-filter arrays for local resolving color sensors

Marcus Frank, Uwe Schallenberg, Norbert Kaiser

OE, Vol. 37, Issue 09, (September 1998) https://doi.org/10.1117/12.10.1117/1.601765

KEYWORDS: Dielectric filters, Sensors, Optical filters, Dielectrics, Etching, Coating, Diodes, Digital filtering, Interference filters, Reactive ion etching

Proceedings Article | 20 April 1998 Paper

Dielectric microfilter arrays for local resolving color sensors

Marcus Frank, Uwe Schallenberg, Norbert Kaiser, Wolfgang Buss

Proceedings Volume 3289, (1998) https://doi.org/10.1117/12.305484

KEYWORDS: Sensors, Interference filters, Diodes, Dielectrics, Coating, Optical filters, Absorption, Photomasks, Light scattering, Receivers

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Proceedings Article | 1 October 1997 Paper

IAD of oxide coatings at low temperature: a comparison of processes based on different ion sources

Hansjoerg Niederwald, Norbert Kaiser, Uwe Schallenberg, Angela Duparre, Detlev Ristau, Michael Kennedy

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.290194

KEYWORDS: Ions, Oxides, Optical coatings, Refractive index, Plasma, Absorption, Atomic force microscopy, Metals, Physical vapor deposition, Deposition processes

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Proceedings Article | 13 May 1997 Paper

Damage-resistant thin film plate polarizer

Uwe Schallenberg, Norbert Kaiser

Proceedings Volume 2966, (1997) https://doi.org/10.1117/12.274287

KEYWORDS: Polarizers, Polarization, Laser damage threshold, Thin films, Optical filters, Fabry–Perot interferometers, Coating, Refractive index, Absorption, Multilayers

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Proceedings Article | 13 May 1997 Paper

Influence of substrate cleaning on LIDT of 355 nm HR coatings

Jean DiJon, Pierre Garrec, Norbert Kaiser, Uwe Schallenberg

Proceedings Volume 2966, (1997) https://doi.org/10.1117/12.274290

KEYWORDS: Laser damage threshold, Contamination, Rhodium, Optical coatings, Interfaces, Laser induced damage, Ultraviolet radiation, Absorption, Quartz, Scattering

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Proceedings Article | 11 April 1997 Paper

Dielectric microfilter arrays for multispectral measuring devices

Marcus Frank, Uwe Schallenberg, Norbert Kaiser, Wolfgang Buss

Proceedings Volume 3008, (1997) https://doi.org/10.1117/12.271423

KEYWORDS: Dielectrics, Chemical elements, Manufacturing, Measurement devices, Optical filters, Interference filters, Etching, Reactive ion etching, Magnesium fluoride, Optical lithography

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SPIE Journal Paper | 1 April 1997

Micropatterned multilayer dielectric filters with two spectral characteristics

Marcus Frank, Uwe Schallenberg, Norbert Kaiser

OE, Vol. 36, Issue 04, (April 1997) https://doi.org/10.1117/12.10.1117/1.601241

KEYWORDS: Etching, Multilayers, Dielectric filters, Dielectrics, Coating, Reactive ion etching, Optical lithography, Dry etching, Antireflective coatings, Optical properties

Proceedings Article | 19 August 1996 Paper

Microstructured multilayer dielectric coatings with binary optical functions

Marcus Frank, Uwe Schallenberg, Norbert Kaiser

Proceedings Volume 2776, (1996) https://doi.org/10.1117/12.246819

KEYWORDS: Dielectrics, Etching, Multilayers, Optical coatings, Dry etching, Dielectric filters, Binary data, Optical filters, Optical lithography, Interfaces

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Proceedings Article | 19 August 1996 Paper

Shift-free narrowband filters for the UV-B region

Hein Uhlig, Uwe Schallenberg, Norbert Kaiser

Proceedings Volume 2776, (1996) https://doi.org/10.1117/12.246821

KEYWORDS: Optical filters, Humidity, Transmittance, Ions, Plasma, Ozone, Silica, Absorbance, Environmental sensing, Dielectric filters

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Proceedings Article | 19 August 1996 Paper

Thin-film plate polarizer with Fabry-Perot filter design

Uwe Schallenberg, Norbert Kaiser

Proceedings Volume 2776, (1996) https://doi.org/10.1117/12.246820

KEYWORDS: Polarizers, Polarization, Thin films, Optical filters, Fabry–Perot interferometers, Refractive index, Transmittance, Multilayers, Computer aided design, Coating

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Proceedings Article | 27 May 1996 Paper

Influence of the number of double layers on the damage threshold of Al2O3/SiO2 and LaF3/MgF2 mirrors at 248 nm

Eric Eva, Klaus Mann, Uwe Schallenberg, Norbert Kaiser, Rainer Henking, Detlev Ristau

Proceedings Volume 2714, (1996) https://doi.org/10.1117/12.240365

KEYWORDS: Coating, Quartz, Laser damage threshold, Mirrors, Crystals, Absorption, Oxides, Magnesium fluoride, Reflectivity, Microscopes

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Proceedings Article | 28 July 1994 Paper

Very high-damage threshold Al2O3/SiO2 dielectric coatings for excimer lasers

Norbert Kaiser, Hein Uhlig, Uwe Schallenberg, Bernhard Anton, Ute Kaiser, Klaus Mann, Eric Eva

Proceedings Volume 2114, (1994) https://doi.org/10.1117/12.180896

KEYWORDS: Laser damage threshold, Optical coatings, Absorption, Excimer lasers, Dielectrics, Ultraviolet radiation, Pulsed laser operation, Multilayers, Oxides, Silica

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Showing 5 of 28 publications

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