Dr. Claas Falldorf
at BIAS - Bremer Institut für angewandte Strahltechnik GmbH
SPIE Involvement:
Conference Program Committee | Author
Publications (41)

Proceedings Article | 20 November 2024 Paper
Proceedings Volume 13241, 132410N (2024) https://doi.org/10.1117/12.3037594
KEYWORDS: Calibration, Light sources and illumination, Light sources, Spectral calibration, Aspheric metrology, Reflection, Optical surfaces, Freeform optics, Wavefronts

SPIE Journal Paper | 5 November 2024 Open Access
OE, Vol. 63, Issue 11, 111801, (November 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.11.111801
KEYWORDS: Digital holography, Holography, Optical metrology, Microscopy, Optical imaging, Physics, Optical engineering, Holograms, Wave propagation, Light sources and illumination

SPIE Journal Paper | 12 July 2024
André Müller, Ralf Bergmann, Claas Falldorf
OE, Vol. 63, Issue 11, 111805, (July 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.11.111805
KEYWORDS: Microscopy, Holograms, Digital holography, Cameras, Holography, Image restoration, Sensors, Diffraction limit, Wave propagation, Light sources and illumination

Proceedings Article | 15 August 2023 Presentation + Paper
Proceedings Volume 12618, 126180T (2023) https://doi.org/10.1117/12.2673783
KEYWORDS: Light sources and illumination, Light emitting diodes, Light sources, 3D metrology, Cameras, Speckle, Partial coherence, Objectives, LED lighting, Imaging systems

Proceedings Article | 10 August 2023 Presentation + Paper
Ralf Bergmann, Claas Falldorf, Alberto Garcia Ortiz, André Müller, Mostafa Agour, Carsten Bockelmann
Proceedings Volume 12619, 1261902 (2023) https://doi.org/10.1117/12.2675922
KEYWORDS: Compressed sensing, Optical metrology, Optical coherence, Information theory, Interferograms, Cameras, Terahertz radiation, Fourier transform interferometers, Phase reconstruction, Image restoration

Showing 5 of 41 publications
Conference Committee Involvement (11)
Optical Metrology and Inspection for Industrial Applications XII
11 October 2025 | Beijing, China
Digital Optical Technologies 2025
23 June 2025 | Munich, Germany
Multimodal Sensing and Artificial Intelligence for Sustainable Future
23 June 2025 | Munich, Germany
Holography: Advances and Modern Trends IX
7 April 2025 | Prague, Czech Republic
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Showing 5 of 11 Conference Committees
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